Pieter De Wit

13 papers A 3C 1Journal 4Unranked 5
YearRankTypeTitle / Venue / Authors
2012 J jnl
Degradation-Resilient Design of a Self-Healing xDSL Line Driver in 90 nm CMOS.
IEEE J. Solid State Circuits
Pieter De Wit, Georges G. E. Gielen
2012 — conf
Designing reliable analog circuits in an unreliable world.
CICC
Georges G. E. Gielen, Elie Maricau, Pieter De Wit
2012 — conf
Offset measurement method for accurate characterization of BTI-induced degradation in opamps.
ICECS
Swaraj Mahato, Pieter De Wit, Elie Maricau, Georges G. E. Gielen
2011 — conf
A failure-resilient xDSL line driver with on-chip degradation monitor.
ESSCIRC
Pieter De Wit, Georges G. E. Gielen
2011 A conf
Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation.
DATE
Georges G. E. Gielen, Elie Maricau, Pieter De Wit
2011 — conf
Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS.
ICECS
Simon Vanden Bussche, Pieter De Wit, Elie Maricau, Georges G. E. Gielen
2010 A conf
Design automation towards reliable analog integrated circuits.
ICCAD
Georges G. E. Gielen, Elie Maricau, Pieter De Wit
2010 C conf
Efficient simulation model for DAC dynamic properties.
ISCAS
Pieter De Wit, Georges G. E. Gielen
2009 J jnl
A 66 µW 86 ppm° C Fully-Integrated 6 MHz Wienbridge Oscillator With a 172 dB Phase Noise FOM.
IEEE J. Solid State Circuits
Valentijn De Smedt, Pieter De Wit, Wim Vereecken, Michiel S. J. Steyaert
2009 J jnl
Erratum to "A 66 µW 86 ppm°C Fully-Integrated 6 MHz Wienbridge Oscillator With a 172 dB Phase Noise FOM" [Jul 09 1990-2001].
IEEE J. Solid State Circuits
Valentijn De Smedt, Pieter De Wit, Wim Vereecken, Michiel Steyaert
2008 — conf
A fully-integrated Wienbridge topology for ultra-low-power 86ppm/°C 65nm CMOS 6MHz clock reference with amplitude regulation.
ESSCIRC
Valentijn De Smedt, Pieter De Wit, Wim Vereecken, Michiel Steyaert
2008 J jnl
An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications.
Microelectron. Reliab.
Elie Maricau, Pieter De Wit, Georges G. E. Gielen
2008 A conf
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies.
DATE
Georges G. E. Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Javier Martín-Martínez, Ben Kaczer, Guido Groeseneken, Rosana Rodríguez, Montserrat Nafría