| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
Pattern Recognit. Lett.
|
| 2026 | J | jnl |
IEEE Trans. Reliab.
|
| 2026 | J | jnl |
Technometrics
|
| 2026 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
Manag. Sci.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
Sensors
|
| 2024 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2023 | J | jnl |
Eur. J. Oper. Res.
|
| 2023 | J | jnl |
IEEE Trans. Inf. Theory
|
| 2021 | J | jnl |
Eur. J. Oper. Res.
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2021 | — | conf |
6GN
|
| 2020 | J | jnl |
IEEE Trans. Comput. Soc. Syst.
|
| 2020 | J | jnl |
IISE Trans.
|
| 2020 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
Eur. J. Oper. Res.
|
| 2018 | A | conf |
Conference on Designing Interactive Systems (Companion Volume)
|
| 2017 | — | conf |
HCI (26)
|
| 2017 | J | jnl |
Technometrics
|
| 2017 | J | jnl |
Pattern Anal. Appl.
|
| 2017 | J | jnl |
Technometrics
|
| 2017 | C | conf |
CSCWD
|
| 2017 | J | jnl |
IEEE Trans. Reliab.
|
| 2016 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | — | conf |
IEEM
|