Pia N. Sanda

17 papers A 7C 1Journal 7Unranked 2
YearRankTypeTitle / Venue / Authors
2010 A conf
Cross-layer resilience challenges: Metrics and optimization.
DATE
Subhasish Mitra, Kevin Brelsford, Pia N. Sanda
2008 J jnl
Fault-Tolerant Design of the IBM Power6 Microprocessor.
IEEE Micro
Kevin Reick, Pia N. Sanda, Scott B. Swaney, Jeffrey W. Kellington, Michael J. Mack, Michael S. Floyd, Daniel Henderson
2008 J jnl
Phaser: Phased methodology for modeling the system-level effects of soft errors.
IBM J. Res. Dev.
Jude A. Rivers, Pradip Bose, Prabhakar Kudva, John-David Wellman, Pia N. Sanda, Ethan H. Cannon, Luiz C. Alves
2008 A conf
Soft Errors: System Effects, Protection Techniques and Case Studies.
DATE
Dimitris Gizopoulos, Kaushik Roy, Subhasish Mitra, Pia N. Sanda
2008 J jnl
Soft-error resilience of the IBM POWER6 processor input/output subsystem.
IBM J. Res. Dev.
Carl A. Bender, Pia N. Sanda, Prabhakar Kudva, Ricardo Mata, Vikas Pokala, Ryan Haraden, Matthew Schallhorn
2008 J jnl
Soft-error resilience of the IBM POWER6 processor.
IBM J. Res. Dev.
Pia N. Sanda, Jeffrey W. Kellington, Prabhakar Kudva, Ronald N. Kalla, Ryan B. McBeth, Jerry Ackaret, Ryan Lockwood, John Schumann, Christopher R. Jones
2008 A conf
Statistical Fault Injection.
DSN
Pradeep Ramachandran, Prabhakar Kudva, Jeffrey W. Kellington, John Schumann, Pia N. Sanda
2007 C conf
Soft Errors: Technology Trends, System Effects, and Protection Techniques.
IOLTS
Subhasish Mitra, Pia N. Sanda, Norbert Seifert
2005 J jnl
Guest Editors' Introduction: Reliability-Aware Microarchitecture.
IEEE Micro
Sarita V. Adve, Pia N. Sanda
2005 A conf
The concern for soft errors is not overblown.
ITC
Pia N. Sanda
2003 J jnl
Latchup Analysis Using Emission Microscopy.
Microelectron. Reliab.
Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda, Philip Wu, Steven C. Wilson
2003 A conf
Optical and Electrical Testing of Latchup in I/O Interface Circuits.
ITC
Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda
2000 — conf
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis.
Asian Test Symposium
Stanislav Polonsky, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Pia N. Sanda
1999 J jnl
Implementation of a self-resetting CMOS 64-bit parallel adder with enhanced testability.
IEEE J. Solid State Circuits
Wei Hwang, George Diedrich Gristede, Pia N. Sanda, Shao Y. Wang, David F. Heidel
1999 A conf
The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA).
ITC
William V. Huott, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Dennis Manzer, Pia N. Sanda, Steven C. Wilson, Yuen H. Chan, Antonio Pelella, Stanislav Polonsky
1998 — conf
Design and implementation of high performance dynamic 64-bit parallel adder with enhanced testability.
CICC
Wei Hwang, George Diedrich Gristede, Pia N. Sanda, Shao Y. Wang, David F. Heidel
1998 A conf
Diagnosis and characterization of timing-related defects by time-dependent light emission.
ITC
Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika