Philippe Roussel

45 papers A* 1A 1B 1Misc 1Journal 14Unranked 27

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	Leakage and TDDB Mechanisms in 18 nm Pitch Direct Metal Etch Ru Interconnects with Airgaps. IRPS Alicja Lesniewska, Y. Fang, G. Delie, Philippe Roussel, Koen Van Sever, Emmanuel Chery, O. Varela Pedreira, Ivan Ciofi, S. H. Park, Zsolt Tokei, Kris Croes
2025	—	`conf`	Local Electric Field-Aware 3D TDDB Model for BEOL Reliability Predictions. IRPS Y. Fang, Alicja Lesniewska, Ivan Ciofi, Philippe Roussel, I. De Wolf, Kris Croes
2025	J	`jnl`	RTNinja: a generalized machine learning framework for analyzing random telegraph noise signals in nanoelectronic devices. CoRR Anirudh Varanasi, Robin Degraeve, Philippe Roussel, Clement Merckling
2024	—	`conf`	BEOL tip-to-tip dielectric reliability characterization using a design-representative test structure. IRPS Yu Fang, Alicja Lesniewska, Ivan Ciofi, Philippe Roussel, Chen Wu, Victor Vega-Gonzalez, Ingrid De Wolf, Kris Croes
2024	—	`conf`	De-Coupling Thermo-Migration from Electromigration Using a Dedicated Test Structure. IRPS O. Varela Pedreira, Youqi Ding, D. Coenen, Philippe Roussel, Ahmed Sobhi Saleh, Veerle Simons, Houman Zahedmanesh, Ivan Ciofi, Kris Croes
2024	—	`conf`	Reducing Reservoir Dimensionality with Phase Space Construction for Simplified Hardware Implementation. ICANN (10) Yuanyang Guo, Robin Degraeve, Philippe Roussel, Ben Kaczer, Erik Bury, Ingrid Verbauwhede
2024	J	`jnl`	Transition-state-theory-based interpretation of Landau double well potential for ferroelectrics. CoRR Md Nur K. Alam, Sergiu Clima, Ben Kaczer, Philippe Roussel, Brecht Truijen, Lars-Åke Ragnarsson, N. Horiguchi, Marc M. Heyns, Jan Van Houdt
2023	—	`conf`	A pragmatic network-aware paradigm for system-level electromigration predictions at scale. IRPS Houman Zahedmanesh, Philippe Roussel, Ivan Ciofi, Kristof Croes
2022	—	`conf`	Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks. IRPS Andrea Vici, Robin Degraeve, João Pedro Bastos, Philippe Roussel, Ingrid De Wolf
2022	—	`conf`	Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors. OFC Kristof Croes, Veerle Simons, Brecht Truijen, Philippe Roussel, Koen Van Sever, Artemisia Tsiara, Jacopo Franco, Philippe Absil
2022	—	`conf`	Degradation mechanisms in Germanium Electro-Absorption Modulators. IRPS Artemisia Tsiara, Alicja Lesniewska, Philippe Roussel, Srinivasan Ashwyn Srinivasan, Mathias Berciano, Marko Simicic, Marianna Pantouvaki, Joris Van Campenhout, Kristof Croes
2022	—	`conf`	Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements. VLSI Technology and Circuits Md Nur K. Alam, Yusuke Higashi, Brecht Truijen, Ben Kaczer, Mihaela Ioana Popovici, Bj O'Sullivan, Philippe Roussel, Robin Degraeve, Marc M. Heyns, Jan Van Houdt
2022	—	`conf`	Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks. IRPS Brecht Truijen, Barry J. O'Sullivan, Md. Nurul Alam, Dieter Claes, Mischa Thesberg, Philippe Roussel, Adrian Vaisman Chasin, Geert Van den Bosch, Ben Kaczer, Jan Van Houdt
2021	—	`conf`	Physics-based device aging modelling framework for accurate circuit reliability assessment. IRPS Zhicheng Wu, Jacopo Franco, Brecht Truijen, Philippe Roussel, Stanislav Tyaginov, Michiel Vandemaele, Erik Bury, Guido Groeseneken, Dimitri Linten, Ben Kaczer
2019	—	`conf`	Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP. IRPS Geert Hellings, Philippe Roussel, Nian Wang, Roman Boschke, Shih-Hung Chen, Marko Simicic, Mirko Scholz, Soeren Stoedel, Kris Myny, Dimitri Linten, Paul Hellings, Nowab Reza M. D. Ashif
2019	—	`conf`	Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. IRPS Alexander Makarov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Alexander Grill, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Tibor Grasser, Dimitri Linten, Stanislav Tyaginov
2019	—	`conf`	Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants. ESSDERC Alexander Makarov, Dimitri Linten, Stanislav Tyaginov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Markus Jech, Tibor Grasser
2019	J	`jnl`	Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations. IEEE Trans. Very Large Scale Integr. Syst. Marko Simicic, Pieter Weckx, Bertrand Parvais, Philippe Roussel, Ben Kaczer, Georges G. E. Gielen
2018	J	`jnl`	A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. Microelectron. Reliab. Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Vamsi Putcha, Erik Bury, Marko Simicic, Adrian Vaisman Chasin, Dimitri Linten, Bertrand Parvais, Francky Catthoor, Gerhard Rzepa, Michael Waltl, Tibor Grasser
2018	—	`conf`	Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications. ESSDERC Jonas Doevenspeck, Robin Degraeve, Stefan Cosemans, Philippe Roussel, Bram-Ernst Verhoef, Rudy Lauwereins, Wim Dehaene
2018	J	`jnl`	Comphy - A compact-physics framework for unified modeling of BTI. Microelectron. Reliab. Gerhard Rzepa, Jacopo Franco, Barry J. O'Sullivan, A. Subirats, Marko Simicic, Geert Hellings, Pieter Weckx, Markus Jech, Theresia Knobloch, Michael Waltl, Philippe Roussel, Dimitri Linten, Ben Kaczer, Tibor Grasser
2018	—	`conf`	Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing. IRPS Deniz Kocaay, Philippe Roussel, Kristof Croes, Ivan Ciofi, Alicja Lesniewska, Ingrid De Wolf
2018	—	`conf`	Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit. ESSDERC Simon Van Beek, Philippe Roussel, Barry J. O'Sullivan, Robin Degraeve, Stefan Cosemans, Dimitri Linten, Gouri Sankar Kar
2017	J	`jnl`	LER and spacing variability on BEOL TDDB using E-field mapping: Impact of field acceleration. Microelectron. Reliab. Deniz Kocaay, Philippe Roussel, Kris Croes, Ivan Ciofi, Yves Saad, Ingrid De Wolf
2016	—	`conf`	Approximating Standard Cell Delay Distributions by Reformulating the Most Probable Failure Point. ERMAVSS@DATE Dimitrios Rodopoulos, Philippe Roussel, Francky Catthoor, Yiannakis Sazeides, Dimitrios Soudris
2015	—	`conf`	Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions. IRPS Simon Van Beek, Koen Martens, Philippe Roussel, Gabriele Luca Donadio, Johan Swerts, Sofie Mertens, Gouri Sankar Kar, Tai Min, Guido Groeseneken
2015	—	`conf`	The defect-centric perspective of device and circuit reliability - From individual defects to circuits. ESSDERC Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Erik Bury, Moonju Cho, Robin Degraeve, Dimitri Linten, Guido Groeseneken, Halil Kukner, Praveen Raghavan, Francky Catthoor, Gerhard Rzepa, Wolfgang Gös, Tibor Grasser
2015	—	`conf`	The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices. IRPS Abhitosh Vais, Koen Martens, Jacopo Franco, Dennis Lin, AliReza Alian, Philippe Roussel, S. Sioncke, Nadine Collaert, Aaron Thean, Marc M. Heyns, Guido Groeseneken, Kristin De Meyer
2014	—	`conf`	Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies. ESSDERC Trong Huynh Bao, Dmitry Yakimets, Julien Ryckaert, Ivan Ciofi, Rogier Baert, Anabela Veloso, Jürgen Bömmels, Nadine Collaert, Philippe Roussel, S. Demuynck, Praveen Raghavan, Abdelkarim Mercha, Zsolt Tokei, Diederik Verkest, Aaron Thean, Piet Wambacq
2012	J	`jnl`	Defect-centric perspective of time-dependent BTI variability. Microelectron. Reliab. Maria Toledano-Luque, Ben Kaczer, Jacopo Franco, Philippe Roussel, Tibor Grasser, Guido Groeseneken
2011	J	`jnl`	Fast and accurate statistical characterization of standard cell libraries. Microelectron. Reliab. Lucas Brusamarello, Gilson I. Wirth, Philippe Roussel, Miguel Miranda
2011	A*	`conf`	Statistical characterization of standard cells using design of experiments with response surface modeling. DAC Miguel Miranda, Philippe Roussel, Lucas Brusamarello, Gilson I. Wirth
2011	A	`conf`	Variability aware modeling for yield enhancement of SRAM and logic. DATE Miguel Miranda, Paul Zuber, Petr Dobrovolný, Philippe Roussel
2010	B	`conf`	On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking. ETS Jouke Verbree, Erik Jan Marinissen, Philippe Roussel, Dimitrios Velenis
2009	—	`conf`	Exponent Monte Carlo for Quick Statistical Circuit Simulation. PATMOS Paul Zuber, Vladimir Matvejev, Philippe Roussel, Petr Dobrovolný, Miguel Miranda
2009	J	`jnl`	Qualitative modelling of a multi-step process: The case of French breadmaking. Expert Syst. Appl. Amadou Ndiaye, Guy Della Valle, Philippe Roussel
2009	—	`conf`	Variability aware modeling of SoCs: From device variations to manufactured system yield. ISQED Miguel Miranda, Bart Dierickx, Paul Zuber, Petr Dobrovolný, F. Kutscherauer, Philippe Roussel, Pavel Poliakov
2007	J	`jnl`	Distribution and generation of traps in SiO Microelectron. Reliab. Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt
2007	J	`jnl`	Gate oxide breakdown in FET devices and circuits: From nanoscale physics to system-level reliability. Microelectron. Reliab. Ben Kaczer, Robin Degraeve, Philippe Roussel, Guido Groeseneken
2007	J	`jnl`	Transient voltage overshoot in TLP testing - Real or artifact? Microelectron. Reliab. David Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken
2006	J	`jnl`	Estimation des titres viraux : une programmation pratique et fiable sur calculatrice de poche, et accessible par l'Internet. Monde des Util. Anal. Données Jocelyne Husson van Vliet, Philippe Roussel
2006	Misc	`conf`	Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations. CODES+ISSS Antonis Papanikolaou, T. Grabner, Miguel Miranda, Philippe Roussel, Francky Catthoor
2005	J	`jnl`	Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectron. Reliab. Yunlong Li, Zsolt Tökei, Philippe Roussel, Guido Groeseneken, Karen Maex
1993	—	`conf`	The Birth of Prolog. HOPL Preprints Alain Colmerauer, Philippe Roussel
1984	—	`conf`	Editing First-Order Proofs: Programmed Rules vs Derived Rules. SLP Maria-Virginia Aponte, José Alberto Fernández, Philippe Roussel