Philippe Perdu

80 papers A 3C 2Journal 75
YearRankTypeTitle / Venue / Authors
2018 J jnl
Automatic localization of signal sources in photon emission images for integrated circuit analysis.
Signal Image Video Process.
Anthony Boscaro, Sabir Jacquir, Samuel Chef, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
2017 C conf
Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory.
FUSION
Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
2017 J jnl
Pattern image enhancement by automatic focus correction.
Microelectron. Reliab.
Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
2016 J jnl
Automatic process for time-frequency scan of VLSI.
Microelectron. Reliab.
Anthony Boscaro, Sabir Jacquir, Kevin Melendez, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
2016 J jnl
Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop.
Microelectron. Reliab.
Chung Tah Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan
2015 J jnl
A way to implement the electro-optical technique to inertial MEMS.
Microelectron. Reliab.
Kevin Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis
2015 J jnl
Editorial.
Microelectron. Reliab.
Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier
2015 J jnl
Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering.
Microelectron. Reliab.
Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
2015 J jnl
Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization.
Microelectron. Reliab.
Nicolas Courjault, Philippe Perdu, Fulvio Infante, Thierry Lebey, Vincent Bley
2015 J jnl
Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location.
J. Electronic Imaging
Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
2015 J jnl
Unsupervised learning for signal mapping in dynamic photon emission.
Microelectron. Reliab.
Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak, Chee Lip Gan
2014 J jnl
A comprehensive study of the application of the EOP techniques on bipolar devices.
Microelectron. Reliab.
Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis
2014 J jnl
Backside spectroscopic photon emission microscopy using intensified silicon CCD.
Microelectron. Reliab.
Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki
2014 J jnl
Pattern image enhancement by extended depth of field.
Microelectron. Reliab.
Samuel Chef, Bastien Billiot, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
2013 J jnl
Frequency mapping in dynamic light emission with wavelet transform.
Microelectron. Reliab.
Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak
2013 J jnl
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.
Microelectron. Reliab.
I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu
2012 J jnl
High performance thermography with InGaAs photon counting camera.
Microelectron. Reliab.
Guillaume Bascoul, Philippe Perdu, Maryse Béguin, Dean Lewis
2012 J jnl
Optimum Si thickness for backside detection of photon emission using Si-CCD.
Microelectron. Reliab.
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
2011 J jnl
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis.
Microelectron. Reliab.
Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet
2011 J jnl
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization.
Microelectron. Reliab.
Fulvio Infante, Philippe Perdu, H. B. Kor, Chee Lip Gan, Dean Lewis
2011 J jnl
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning.
Microelectron. Reliab.
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
2011 J jnl
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis.
Microelectron. Reliab.
Guillaume Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis
2010 J jnl
CADless laser assisted methodologies for failure analysis and device reliability.
Microelectron. Reliab.
A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis
2010 J jnl
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below).
Microelectron. Reliab.
Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet
2010 J jnl
Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations.
Microelectron. Reliab.
Fulvio Infante, Philippe Perdu, Dean Lewis
2010 J jnl
VLSI functional analysis by dynamic emission microscopy.
Microelectron. Reliab.
Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura
2010 A conf
When Failure Analysis Meets Side-Channel Attacks.
CHES
Jerome Di-Battista, Jean-Christophe Courrège, Bruno Rouzeyre, Lionel Torres, Philippe Perdu
2009 J jnl
Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics.
Microelectron. Reliab.
F. Molière, B. Foucher, Philippe Perdu, Alain Bravaix
2009 J jnl
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package.
Microelectron. Reliab.
Fulvio Infante, Philippe Perdu, Dean Lewis
2008 J jnl
Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques.
Microelectron. Reliab.
Mohsine Bouya, Nathalie Malbert, Nathalie Labat, D. Carisetti, Philippe Perdu, J. C. Clement, Benoit Lambert, M. Bonnet
2008 J jnl
Dynamic study of the thermal laser stimulation response on advanced technology structures.
Microelectron. Reliab.
Antoine Reverdy, M. de la Bardonnie, Patrick Poirier, H. Murray, Philippe Perdu, A. Boukkali
2008 J jnl
Effect of physical defect on shmoos in CMOS DSM technologies.
Microelectron. Reliab.
Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely
2008 J jnl
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs.
Microelectron. Reliab.
Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis
2008 J jnl
Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology.
Microelectron. Reliab.
Antoine Reverdy, Philippe Perdu, H. Murray, M. de la Bardonnie, Patrick Poirier
2008 J jnl
Generic simulator for faulty IC.
Microelectron. Reliab.
Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier
2007 J jnl
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications.
Microelectron. Reliab.
Felix Beaudoin, Kevin Sanchez, Philippe Perdu
2007 A conf
Identification of process/design issues during 0.18 µm technology qualification for space application.
DATE
Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis
2007 J jnl
Long-term reliability of silicon bipolar transistors subjected to low constraints.
Microelectron. Reliab.
A. Crosson, Laurent Escotte, Marise Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, Guy Perez
2007 J jnl
Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC.
Microelectron. Reliab.
Mohsine Bouya, D. Carisetti, Nathalie Malbert, Nathalie Labat, Philippe Perdu, J. C. Clement, M. Bonnet, G. Pataut
2006 J jnl
Application of various optical techniques for ESD defect localization.
Microelectron. Reliab.
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
2006 J jnl
Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards.
Microelectron. Reliab.
Christophe De Nardi, Romain Desplats, Philippe Perdu, Jean-Luc Gauffier, Christophe Guérin
2006 J jnl
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.
Microelectron. Reliab.
Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat
2005 J jnl
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectron. Reliab.
Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis
2005 J jnl
Dynamic Laser Stimulation Case Studies.
Microelectron. Reliab.
Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte
2005 C conf
Electrical Modeling for Laser Testing with Different Pulse Durations.
IOLTS
Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu
2005 J jnl
Failure analysis of micro-heating elements suspended on thin membranes.
Microelectron. Reliab.
Danick Briand, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu
2005 J jnl
Impact of semiconductors material on IR Laser Stimulation signal.
Microelectron. Reliab.
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
2005 J jnl
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis.
Microelectron. Reliab.
Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit
2005 J jnl
NIR laser stimulation for dynamic timing analysis.
Microelectron. Reliab.
Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis
2005 J jnl
Oxide charge measurements in EEPROM devices.
Microelectron. Reliab.
C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier
2004 J jnl
Femtosecond Laser Ablation for Backside Silicon Thinning.
Microelectron. Reliab.
Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu
2004 J jnl
Implementation of TRE systems into Emission Microscopes.
Microelectron. Reliab.
Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu
2004 J jnl
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?
Microelectron. Reliab.
Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis
2004 J jnl
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.
Microelectron. Reliab.
Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas
2004 J jnl
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.
Microelectron. Reliab.
Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti
2004 J jnl
Study of the ESD defects impact on ICs reliability.
Microelectron. Reliab.
Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis
2004 J jnl
Time Resolved Photon Emission Processing Flow for IC Analysis.
Microelectron. Reliab.
Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis
2004 J jnl
Understanding the effects of NIR laser stimulation on NMOS transistor.
Microelectron. Reliab.
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
2003 J jnl
A physical approach on SCOBIC investigation in VLSI.
Microelectron. Reliab.
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
2003 J jnl
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).
Microelectron. Reliab.
Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat
2003 J jnl
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectron. Reliab.
Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari
2003 A conf
Fault Localization using Time Resolved Photon Emission and STIL Waveforms.
ITC
Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah
2003 J jnl
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.
Microelectron. Reliab.
Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
2003 J jnl
Magnetic emission mapping for passive integrated components characterisation.
Microelectron. Reliab.
Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina
2003 J jnl
Short defect characterization based on TCR parameter extraction.
Microelectron. Reliab.
Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis
2003 J jnl
Solar Cell Analysis with Light Emission and OBIC Techniques.
Microelectron. Reliab.
Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu
2003 J jnl
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.
Microelectron. Reliab.
David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères
2003 J jnl
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectron. Reliab.
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
2003 J jnl
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations.
Microelectron. Reliab.
Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis
2002 J jnl
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.
Microelectron. Reliab.
Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement
2002 J jnl
Backside Hot Spot Detection Using Liquid Crystal Microscopy.
Microelectron. Reliab.
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis
2002 J jnl
IR confocal laser microscopy for MEMS Technological Evaluation.
Microelectron. Reliab.
Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats
2002 J jnl
Magnetic field measurements for Non Destructive Failure Analysis.
Microelectron. Reliab.
Olivier Crépel, C. Goupil, Bernadette Domengès, Philippe Descamps, Philippe Perdu, A. Doukkali
2002 J jnl
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.
Microelectron. Reliab.
Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis
2001 J jnl
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits.
Microelectron. Reliab.
Romain Desplats, Philippe Perdu, Felix Beaudoin
2001 J jnl
Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology.
IEEE J. Solid State Circuits
Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, Quang Nguyen, Nicolas Mauran, David Trémouilles, Philippe Perdu
2001 J jnl
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.
Microelectron. Reliab.
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
2001 J jnl
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.
Microelectron. Reliab.
Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu
2001 J jnl
Modeling Thermal Laser Stimulation.
Microelectron. Reliab.
Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis
2001 J jnl
Silicon Thinning and Polishing on Packaged Devices.
Microelectron. Reliab.
Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis