Philippe Dupuy

12 papers Journal 12
YearRankTypeTitle / Venue / Authors
2026 J jnl
Green spread of US municipal bonds.
Ann. Oper. Res.
Mahdi Sojoudi, Carole Bernard, Philippe Dupuy, Gareth W. Peters
2017 J jnl
Mechanisms of power module source metal degradation during electro-thermal aging.
Microelectron. Reliab.
R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros
2015 J jnl
In-depth investigation of metallization aging in power MOSFETs.
Microelectron. Reliab.
R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros
2014 J jnl
3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions.
Microelectron. Reliab.
Michele Riccio, Vincenzo d'Alessandro, Andrea Irace, Gilles Rostaing, Mounira Berkani, Stéphane Lefebvre, Philippe Dupuy
2014 J jnl
Universal mechanisms of Al metallization ageing in power MOSFET devices.
Microelectron. Reliab.
Donatien Martineau, Colette Levade, Marc Legros, Philippe Dupuy, Thomas Mazeaud
2013 J jnl
Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications.
Microelectron. Reliab.
Gilles Rostaing, Mounira Berkani, D. Mechouche, Denis Labrousse, Stéphane Lefebvre, Zoubir Khatir, Philippe Dupuy
2011 J jnl
3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs.
Microelectron. Reliab.
Toufik Azoui, Patrick Tounsi, Philippe Dupuy, Laurent Guillot, Jean-Marie Dorkel
2010 J jnl
Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue.
Microelectron. Reliab.
Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade
2009 J jnl
Characterization of ageing failures on power MOSFET devices by electron and ion microscopies.
Microelectron. Reliab.
Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade, G. Vanderschaeve
2007 J jnl
Characterization and modelling of ageing failures on power MOSFET devices.
Microelectron. Reliab.
B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, Emmanuel Scheid
2005 J jnl
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue.
Microelectron. Reliab.
B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin
2001 J jnl
Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter.
Microelectron. Reliab.
Gerard Coquery, S. Carubelli, Jean-Pierre Ousten, Richard Lallemand, Frederic Lecoq, Dominique Lhotellier, V. de Viry, Philippe Dupuy