Philippe Descamps

17 papers C 2Journal 9Unranked 6
YearRankTypeTitle / Venue / Authors
2024 J jnl
A 26-28 GHz, Two-Stage, Low-Noise Amplifier for Fifth-Generation Radio Frequency and Millimeter-Wave Applications.
Sensors
Aymen Ben Hammadi, Mohamed Aziz Doukkali, Philippe Descamps, Constant Niamien
2019 — conf
Applied TRL Calibration Method to Differential Devices Embedded in a Test Board.
RWS
Kassem Hamze, Daniel Pasquet, Philippe Descamps, Edouard De Ledinghen
2017 C conf
Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism.
IECON
Insaf Lahbib, Aziz Doukkali, Patrick Martin, Philippe Descamps, Guy Imbert
2016 — conf
An Experience of Engineering of MAS for Smart Environments: Extension of ASPECS.
IIMSS
Philippe Descamps, Vincent Hilaire, Olivier Lamotte, Sebastian Rodriguez
2015 — conf
An Analysis and Prototyping Approach for Cyber-Physical Systems.
FNC/MobiSPC
Samuel Deniaud, Philippe Descamps, Vincent Hilaire, Olivier Lamotte, Sebastian Rodriguez
2015 J jnl
Multi-Agent System for intelligent Scrum project management.
Integr. Comput. Aided Eng.
Yishuai Lin, Philippe Descamps, Nicolas Gaud, Vincent Hilaire, Abderrafiaa Koukam
2013 — conf
Reducing substrate noise coupling in a 3D-PICS Integrated Passive Device by localized P+ guard rings.
RWS
Miled Ben Salah, Daniel Pasquet, Frederic Voiron, Philippe Descamps, Jean Luc Lefebvre, Dominique Lesenechal
2013 — conf
Reducing substrate noise coupling in a 3D-PICS Integrated Passive Device by localized P+ guard rings.
WiSNet
Miled Ben Salah, Daniel Pasquet, Frederic Voiron, Philippe Descamps, Jean Luc Lefebvre, Dominique Lesenechal
2012 — conf
Influence of the output harmonic networks of classes F and F
NEWCAS
Ronald Montesinos, Corinne Berland, Mazen Abi-Hussein, Olivier Venard, Philippe Descamps
2012 C conf
Performances of RF PA classes in LINC systems.
ISCAS
Ronald Montesinos, Corinne Berland, Mazen Abi-Hussein, Olivier Venard, Philippe Descamps
2008 J jnl
Determination of temperature change inside IC packages during laser ablation of molding compound.
Microelectron. Reliab.
P. Schwindenhammer, H. Murray, Philippe Descamps, Patrick Poirier
2005 J jnl
Isolating failing sites in IC packages using time domain reflectometry: Case studies.
Microelectron. Reliab.
Dolphin Abessolo-Bidzo, Patrick Poirier, Philippe Descamps, Bernadette Domengès
2004 J jnl
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.
Microelectron. Reliab.
Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti
2004 J jnl
Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current.
Microelectron. Reliab.
F. Barbier, Fabrice Blanc, A. Le Grontec, R. Colclaser, Theo Smedes, M. Johnson, Serge Bardy, Philippe Descamps
2003 J jnl
Magnetic emission mapping for passive integrated components characterisation.
Microelectron. Reliab.
Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina
2002 J jnl
Comprehensive failure analysis of leakage faults in bipolar transistors.
Microelectron. Reliab.
Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps
2002 J jnl
Magnetic field measurements for Non Destructive Failure Analysis.
Microelectron. Reliab.
Olivier Crépel, C. Goupil, Bernadette Domengès, Philippe Descamps, Philippe Perdu, A. Doukkali