Phil Nigh - RankMe

40 papers A 24B 1C 1Misc 7Journal 4Unranked 3

Year	Rank	Type	Title / Venue / Authors
2016	B	`conf`	Testing in the year 2024 - big changes are coming. ETS Phil Nigh
2014	A	`conf`	Board manufacturing test correlation to IC manufacturing test. ITC C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy
2013	A	`conf`	Adaptive testing - Cost reduction through test pattern sampling. ITC Matt Grady, Bradley Pepper, Joshua Patch, Michael Degregorio, Phil Nigh
2012	J	`jnl`	Guest Editors' Introduction: Yield Learning Processes and Methods. IEEE Des. Test Comput. Anne E. Gattiker, Phil Nigh
2012	A	`conf`	How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond? ITC Phil Nigh
2012	J	`jnl`	Physically-Aware N-Detect Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar
2011	A	`conf`	Industry leaders panel - How will testing change in the next 10 years? ITC Phil Nigh
2011	A	`conf`	Using well/substrate bias manipulation to enhance voltage-test-based defect detection. ITC Anne E. Gattiker, Phil Nigh
2009	A	`conf`	Application of non-parametric statistics of the parametric response for defect diagnosis. ITC Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin
2008	A	`conf`	Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. ITC Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar
2008	Misc	`conf`	How Many Test Patterns are Useless? VTS François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh
2008	—	`conf`	The Evolving Role of Test ... it is now a "Value Add" Operation. DFT Phil Nigh
2006	J	`jnl`	Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. IEEE Des. Test Comput. Phil Nigh
2006	Misc	`conf`	Session Abstract. VTS Phil Nigh
2005	—	`conf`	Defect-Oriented Test for Ultra-Low DPM. Asian Test Symposium Vikram Iyengar, Phil Nigh
2004	A	`conf`	Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. ITC Phil Nigh
2004	A	`conf`	Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. ITC Phil Nigh, Anne E. Gattiker
2004	A	`conf`	Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". ITC Phil Nigh
2003	A	`conf`	The Increasing Importance of On-line Testing to Ensure High-Reliability Products. ITC Phil Nigh
2002	Misc	`conf`	Debating the Future of Burn-In. VTS Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers
2002	A	`conf`	Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. ITC Phil Nigh
2001	Misc	`conf`	MINVDD Testing for Weak CMOS ICs. VTS Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh
2000	A	`conf`	Test method evaluation experiments and data. ITC Phil Nigh, Anne E. Gattiker
1999	A	`conf`	Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong
1998	Misc	`conf`	Best Methods for At-Speed Testing? VTS Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh
1998	—	`conf`	Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh
1998	A	`conf`	Diagnosis and characterization of timing-related defects by time-dependent light emission. ITC Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika
1998	A	`conf`	Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC Phil Nigh, David P. Vallett, Atul Patel, Jason Wright
1998	A	`conf`	SIA Roadmap: test must not limit future technologies. ITC Phil Nigh
1997	Misc	`conf`	An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
1997	A	`conf`	Application and Analysis of IDDQ Diagnostic Software. ITC Phil Nigh, Donato O. Forlenza, Franco Motika
1997	A	`conf`	Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. ITC Adit D. Singh, Phil Nigh, C. Mani Krishna
1997	A	`conf`	So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
1996	Misc	`conf`	Volume Manufacturing - ICs and Boards: DFT to the Rescue? VTS Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck
1994	A	`conf`	ASIC Test Cost/Strategy Trade-offs. ITC Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix
1990	J	`jnl`	Test Generation for Current Testing (CMOS ICs). IEEE Des. Test Comput. Phil Nigh, Wojciech Maly
1989	A	`conf`	Layout-driven test generation. ICCAD Phil Nigh, Wojciech Maly
1988	A	`conf`	Built-in current testing-feasibility study. ICCAD Wojciech Maly, Phil Nigh
1988	C	`conf`	Current sensing for built-in testing of CMOS circuits. ICCD Derek B. I. Feltham, Phil Nigh, L. Richard Carley, Wojciech Maly
1988	A	`conf`	Testing oriented analysis of CMOS ICs with opens. ICCAD Wojciech Maly, Pranab K. Nag, Phil Nigh