Peter Sarson

26 papers A 5B 1C 2Misc 9Journal 4Unranked 5
YearRankTypeTitle / Venue / Authors
2019 C conf
Automated Die Inking through On-line Machine Learning.
IOLTS
Constantinos Xanthopoulos, Arnold Neckermann, Paulus List, Klaus-Peter Tschernay, Peter Sarson, Yiorgos Makris
2019 Misc conf
Innovative Practices on Automotive Test.
VTS
Wim Dobbelaere, Marco Restifo, Peter Sarson
2018 J jnl
A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment.
J. Electron. Test.
Peter Sarson, Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Haruo Kobayashi
2018 Misc conf
Group delay measurement of frequency down-converter devices using chirped RF modulated signal.
VTS
Peter Sarson, Tomonori Yanagida, Kosuke Machida
2018 Misc conf
High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs.
VTS
Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson, Andreas Wiesner
2018 Misc conf
IP session on ISO26262 EDA.
VTS
Art Schaldenbrand, Yervant Zorian, Stephen Sunter, Peter Sarson
2018 J jnl
Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal.
J. Electron. Test.
Peter Sarson, Tomonori Yanagida, Kosuke Machida
2018 Misc conf
Online information utility assessment for per-device adaptive test flow.
VTS
Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev
2018 Misc conf
Special session on BIST/calibration of A/MS devices.
VTS
Hans-Mart von Staudt, James Izon, Sule Ozev, Peter Sarson
2018 C conf
Towards an automatic approach for hardware verification according to ISO 26262 functional safety standard.
IOLTS
Jacopo Sini, Matteo Sonza Reorda, Massimo Violante, Peter Sarson
2017 Misc conf
A technique for dynamic range improvement of intermodulation distortion products for an Interpolating DAC-based Arbitrary Waveform Generator using a phase switching algorithm.
VTS
Peter Sarson, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi
2017 A conf
A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods.
ITC
Stephen Sunter, Peter Sarson
2017 J jnl
An ATE Filter Characterization ToolKit Using a Discrete Chirped Excitation Signal as Stimulus.
J. Electron. Test.
Peter Sarson
2017 — conf
An automatic approach to perform the verification of hardware designs according to the ISO26262 functional safety standard.
LATS
Enea Bagalini, Jacopo Sini, Matteo Sonza Reorda, Massimo Violante, H. Klimesch, Peter Sarson
2017 A conf
Automated die inking: A pattern recognition-based approach.
ITC
Constantinos Xanthopoulos, Peter Sarson, Heinz Reiter, Yiorgos Makris
2017 — conf
Fault-based test methodology for analog amplifier circuits.
EWDTS
Josip Mikulic, Peter Sarson, Gregor Schatzberger, Adrijan Baric
2017 Misc conf
Innovative practices session 7C automotive quality assurance.
VTS
Peter Sarson
2017 A conf
Use models for extending IEEE 1687 to analog test.
ITC
Peter Sarson, Jeff Rearick
2017 J jnl
Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs.
J. Electron. Test.
Peter Sarson, Haruo Kobayashi
2016 B conf
Group delay filter measurement using a chirp.
ETS
Peter Sarson
2016 A conf
Test time efficient group delay filter characterization technique using a discrete chirped excitation signal.
ITC
Peter Sarson
2016 A conf
Variation and failure characterization through pattern classification of test data from multiple test stages.
ITC
Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng
2016 — conf
Very low supply voltage room temperature test to screen low temperature soft blown fuse fails which result in a resistive bridge.
ISQED
Peter Sarson
2016 Misc conf
Yield improvement of an EEPROM for automotive applications while maintaining high reliability.
VTS
Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson
2014 — conf
RF filter characterization using a chirp.
IDT
Peter Sarson
2013 — conf
Automotive EEPROM Qualification and Cost Optimization.
Asian Test Symposium
Peter Sarson, Gregor Schatzberger, Robert Seitz