| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
CAI
|
| 2025 | J | jnl |
Adv. Eng. Informatics
|
| 2024 | — | conf |
SAI (1)
|
| 2023 | J | jnl |
CoRR
|
| 2022 | — | book |
System Sustainment
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
ICPHM
|
| 2013 | J | jnl |
J. Comput. Inf. Sci. Eng.
|
| 2012 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2009 | J | jnl |
IEEE Trans. Reliab.
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2006 | J | jnl |
Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly.
J. Electron. Test.
|
| 2005 | J | jnl |
A warranty forecasting model based on piecewise statistical distributions and stochastic simulation.
Reliab. Eng. Syst. Saf.
|
| 2003 | A | conf |
ITC
|
| 2002 | A* | conf |
DAC
|
| 2001 | A | conf |
A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assembly.
ITC
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 1998 | J | jnl |
IEEE Des. Test Comput.
|
| 1997 | J | jnl |
J. Electron. Test.
|
| 1994 | J | jnl |
IEEE Des. Test Comput.
|
| 1994 | J | jnl |
J. Electron. Test.
|
| 1994 | J | jnl |
J. Electron. Test.
|