Peter Sandborn

26 papers A* 1A 2Journal 19Unranked 3
YearRankTypeTitle / Venue / Authors
2025 J jnl
Multimodal Generative AI for Story Point Estimation in Software Development.
CoRR
Mohammad Rubyet Islam, Peter Sandborn
2025 — conf
Multimodal Generative AI for Story Point Estimation.
CAI
Mohammad Rubyet Islam, Peter Sandborn
2025 J jnl
Using sociotechnical network modeling to analyze the impact of blockchain for supply chain on the risk of procuring counterfeit electronic parts.
Adv. Eng. Informatics
Hirbod Akhavantaheri, Peter Sandborn, Diganta Das
2024 — conf
Analyzing the Influence of Processor Speed and Clock Speed on Remaining Useful Life Estimation of Software Systems.
SAI (1)
Mohammad Rubyet Islam, Peter Sandborn
2023 J jnl
Demonstration of a Response Time Based Remaining Useful Life (RUL) Prediction for Software Systems.
CoRR
Ray Islam, Peter Sandborn
2022 — book
System Sustainment - Acquisition and Engineering Processes for the Sustainment of Critical and Legacy Systems
System Sustainment
Peter Sandborn, William Lucyshyn
2015 J jnl
A return on investment analysis of applying health monitoring to LED lighting systems.
Microelectron. Reliab.
Moon-Hwan Chang, Peter Sandborn, Michael G. Pecht, Winco K. C. Yung, Wenbin Wang
2015 J jnl
Assessing the value of a lead-free solder control plan using cost-based FMEA.
Microelectron. Reliab.
Edwin Lillie, Peter Sandborn, David Humphrey
2015 — conf
PHM based predictive maintenance optimization for offshore wind farms.
ICPHM
Xin Lei, Peter Sandborn, Roozbeh Bakhshi, Amir Kashani-Pour, Navid Goudarzi
2013 J jnl
Ontology-Based Knowledge Representation for Obsolescence Forecasting.
J. Comput. Inf. Sci. Eng.
Liyu Zheng, Raymond Nelson, Janis P. Terpenny, Peter Sandborn
2012 J jnl
A part total cost of ownership model for long life cycle electronic systems.
Int. J. Comput. Integr. Manuf.
Varun J. Prabhakar, Peter Sandborn
2011 J jnl
Forecasting electronic part procurement lifetimes to enable the management of DMSMS obsolescence.
Microelectron. Reliab.
Peter Sandborn, Varun J. Prabhakar, O. Ahmad
2009 J jnl
A Methodology for Determining the Return on Investment Associated With Prognostics and Health Management.
IEEE Trans. Reliab.
Kiri Feldman, Taoufik Jazouli, Peter Sandborn
2007 J jnl
Introduction to special section on electronic systems prognostics and health management.
Microelectron. Reliab.
Peter Sandborn, Michael G. Pecht
2007 J jnl
Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics.
Microelectron. Reliab.
E. Scanff, K. L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Foucher
2006 J jnl
Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly.
J. Electron. Test.
Zhen Shi, Peter Sandborn
2005 J jnl
A warranty forecasting model based on piecewise statistical distributions and stochastic simulation.
Reliab. Eng. Syst. Saf.
Andre Kleyner, Peter Sandborn
2003 A conf
Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms.
ITC
Zhen Shi, Peter Sandborn
2002 A* conf
A detailed cost model for concurrent use with hardware/software co-design.
DAC
Daniel Ragan, Peter Sandborn, Paul Stoaks
2001 A conf
A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assembly.
ITC
Thiagarajan Trichy, Peter Sandborn, Ravi Raghavan, Shubhada Sahasrabudhe
2001 J jnl
Process capability indices and product reliability.
Microelectron. Reliab.
Bharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht
1998 J jnl
Analyzing Packaging Trade-Offs During System Design.
IEEE Des. Test Comput.
Peter Sandborn, Mike Vertal
1997 J jnl
Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die.
J. Electron. Test.
Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn
1994 J jnl
Analyzing Multichip Module Testing Strategies.
IEEE Des. Test Comput.
Magdy S. Abadir, Ashish R. Parikh, Linda Bal, Peter Sandborn, Ken Drake
1994 J jnl
High Level Test Economics Advisor (Hi-TEA).
J. Electron. Test.
Magdy S. Abadir, Ashish Parikh, Linda Bal, Peter Sandborn, Cynthia F. Murphy
1994 J jnl
Multichip systems trade-off analysis tool.
J. Electron. Test.
Peter Sandborn, Rajarshi Ghosh, Ken Drake, Magdy S. Abadir, Linda Bal, Ashish Parikh