Peter Muhmenthaler

11 papers A 7Misc 2Unranked 2
YearRankTypeTitle / Venue / Authors
2006 — conf
New on-Chip DFT and ATE Features for Efficient Embedded Memory Test.
MTDT
Peter Muhmenthaler
2006 Misc conf
Session Abstract.
VTS
Ajay Khoche, Peter Muhmenthaler
2005 A conf
Compression mode diagnosis enables high volume monitoring diagnosis flow.
ITC
Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai
2004 A conf
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code.
DATE
Andreas Leininger, Michael Gössel, Peter Muhmenthaler
2003 A conf
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions.
ITC
Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski
2002 A conf
Outsourcing Test without Standards?
ITC
Peter Muhmenthaler
2001 A conf
Embedded tutorial: TRP: integrating embedded test and ATE.
DATE
Yervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher
2000 A conf
Tutorial Statement.
DATE
Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf
1999 — conf
Cost effective testing of systems on silicon: areas for optimization.
ETW
Peter Muhmenthaler
1991 Misc conf
Enhanced fault modeling for DRAM test and analysis.
VTS
H.-D. Oberle, M. Maue, Peter Muhmenthaler
1991 A conf
Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM.
ITC
H.-D. Oberle, Peter Muhmenthaler