Peter Jacob

18 papers Journal 18
YearRankTypeTitle / Venue / Authors
2025 J jnl
Balancing Cobot Productivity and Longevity Through Pre-Runtime Developer Feedback.
IEEE Robotics Autom. Lett.
Emil Stubbe Kolvig Raun, Jakob Hviid, Mikkel Baun Kjærgaard, Ralph Brorsen, Peter Jacob
2021 J jnl
Toward an Optimal Definition of Hypoglycemia with Continuous Glucose Monitoring.
Comput. Methods Programs Biomed.
Zeinab Mahmoudi, Simone Del Favero, Peter Jacob, Pratik Choudhary, Hypo-RESOLVE Consortium
2017 J jnl
A very unusual transistor failure, caused by a solenoid.
Microelectron. Reliab.
Peter Jacob, Roman Furrer
2017 J jnl
New ESD challenges in RFID manufacturing.
Microelectron. Reliab.
Peter Jacob, Uwe Thiemann
2016 J jnl
Early life field failures in modern automotive electronics - An overview; root causes and precautions.
Microelectron. Reliab.
Peter Jacob
2016 J jnl
Failure mechanisms and precautions in plug connectors and relays.
Microelectron. Reliab.
Peter Jacob
2015 J jnl
Failure analysis and reliability on system level.
Microelectron. Reliab.
Peter Jacob
2015 J jnl
Unusual defects, generated by wafer sawing: An update, including pick&place processing.
Microelectron. Reliab.
Peter Jacob
2013 J jnl
Failure causes generating aluminium protrusion/extrusion.
Microelectron. Reliab.
Peter Jacob, Giovanni Nicoletti
2011 J jnl
From component to system failure analysis - The future challenge within work-sharing supply chains.
Microelectron. Reliab.
Peter Jacob
2011 J jnl
Impact of IT-supported clinical pathways on medical staff satisfaction. A prospective longitudinal cohort study.
Int. J. Medical Informatics
Jochen Schuld, Thilo Schäfer, Stefan Nickel, Peter Jacob, Martin K. Schilling, Sven Richter
2009 J jnl
Reading distance degradation mechanisms of near-field RFID devices.
Microelectron. Reliab.
Peter Jacob, Willy Knecht, Albert Kunz, Giovanni Nicoletti, Thomas Lautenschlager, Moreno Mondada, Damien Pachoud
2008 J jnl
Surface ESD (ESDFOS) in assembly fab machineries as a functional and reliability risk - Failure analysis, tool diagnosis and on-site-remedies.
Microelectron. Reliab.
Peter Jacob
2008 J jnl
Unusual defects, generated by wafer sawing: Diagnosis, mechanisms and how to distinguish from related failures.
Microelectron. Reliab.
Peter Jacob, Werner Rothkirch
2007 J jnl
Device decapsulated (and/or depassivated) - Retest ok - What happened?
Microelectron. Reliab.
Peter Jacob, Giovanni Nicoletti, Florian Hauf
2006 J jnl
Reliability and wearout characterisation of LEDs.
Microelectron. Reliab.
Peter Jacob, Albert Kunz, Giovanni Nicoletti
2005 J jnl
Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing.
Microelectron. Reliab.
Peter Jacob, Uwe Thiemann, Joachim C. Reiner
2004 J jnl
Electrostatic Effects on Semiconductor Tools.
Microelectron. Reliab.
Peter Jacob, Joachim C. Reiner