Peter Harrod

18 papers A* 1A 3B 2C 1Journal 7Unranked 4
YearRankTypeTitle / Venue / Authors
2021 — conf
An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults.
DFT
Anuraag Narang, Balaji Venn, S. Saqib Khursheed, Peter Harrod
2018 J jnl
Addressing Functional Safety Challenges in Autonomous Vehicles with the Arm TCL S Architecture.
IEEE Des. Test
Xabier Iturbe, Balaji Venu, Juergen Jagst, Emre Ozer, Peter Harrod, Chris Turner, John Penton
2018 A* conf
Error Correlation Prediction in Lockstep Processors for Safety-Critical Systems.
MICRO
Emre Ozer, Balaji Venu, Xabier Iturbe, Shidhartha Das, Spyros Lyberis, John Biggs, Peter Harrod, John Penton
2010 J jnl
Gate-Sizing-Based Single V
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty, Peter Harrod
2009 J jnl
Diagnosis of Multiple-Voltage Design With Bridge Defect.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod
2009 J jnl
Process Variation-Aware Test for Resistive Bridges.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Urban Ingelsson, Bashir M. Al-Hashimi, S. Saqib Khursheed, Sudhakar M. Reddy, Peter Harrod
2009 A conf
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing.
DATE
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod
2008 C conf
A New Approach for Transient Fault Injection Using Symbolic Simulation.
IOLTS
Ashish Darbari, Bashir M. Al-Hashimi, Peter Harrod, Daryl Bradley
2008 B conf
Bridge Defect Diagnosis for Multiple-Voltage Design.
ETS
S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod
2008 J jnl
Bridging Fault Test Method With Adaptive Power Management Awareness.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosinger, Bashir M. Al-Hashimi, Peter Harrod
2008 — conf
Variation Aware Analysis of Bridging Fault Testing.
ATS
Urban Ingelsson, Bashir M. Al-Hashimi, Peter Harrod
2007 — conf
Resistive Bridging Faults DFT with Adaptive Power Management Awareness.
ATS
Urban Ingelsson, Paul M. Rosinger, S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod
2006 B conf
Dynamic Voltage Scaling Aware Delay Fault Testing.
ETS
Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi, Peter Harrod
2003 A conf
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data.
ITC
Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod
2000 — conf
Microprocessor cores.
ETW
Andrew Burdass, Gary Campbell, Richard Grisenthwaite, David Gwilt, Peter Harrod, Richard York
1999 J jnl
Test in the Emerging Intellectual Property Business.
IEEE Des. Test Comput.
Robin Saxby, Peter Harrod
1999 A conf
Testing reusable IP-a case study.
ITC
Peter Harrod
1993 J jnl
Boundary-scan design for cost-sensitive applications.
Microprocess. Microsystems
Peter Harrod