Peter C. Maxwell

45 papers A 20B 7Misc 5Journal 12Unranked 1

Year	Rank	Type	Title / Venue / Authors
2021	J	`jnl`	Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski
2018	A	`conf`	Total Critical Area Based Testing. ITC Friedrich Hapke, Peter C. Maxwell
2017	B	`conf`	Bridge over troubled waters: Critical area based pattern generation. ETS Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh
2016	B	`conf`	Cell-aware diagnosis: Defective inmates exposed in their cells. ETS Peter C. Maxwell, Friedrich Hapke, Huaxing Tang
2016	B	`conf`	ETS 2015 best paper. ETS Hans-Joachim Wunderlich, Peter C. Maxwell
2012	B	`conf`	Adaptive testing: Conquering process variations. ETS Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell
2011	J	`jnl`	Adaptive Testing: Dealing with Process Variability. IEEE Des. Test Comput. Peter C. Maxwell
2011	B	`conf`	Towards Variation-Aware Test Methods. ETS Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell
2010	B	`conf`	Adaptive test directions. ETS Peter C. Maxwell
2007	A	`conf`	Principles and results of some test cost reduction methods for ASICs. ITC Peter C. Maxwell
2007	B	`conf`	Wafer Level Reliability Screens. ETS Peter C. Maxwell
2006	A	`conf`	The Design, Implementation and Analysis of Test Experiments. ITC Peter C. Maxwell
2003	J	`jnl`	Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings. IEEE Des. Test Comput. Peter C. Maxwell
2002	Misc	`conf`	Debating the Future of Burn-In. VTS Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers
2002	J	`jnl`	Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era. IEEE Des. Test Comput. Jaume Segura, Peter C. Maxwell
2002	A	`conf`	The Heisenberg Uncertainty of Test. ITC Peter C. Maxwell
2002	A	`conf`	Wafer/Package Test Mix for Optimal Defect Detection. ITC Peter C. Maxwell
2000	A	`conf`	Comparing functional and structural tests. ITC Peter C. Maxwell, Ismed Hartanto, Lee Bentz
2000	A	`conf`	Current ratios: a self-scaling technique for production IDDQ testing. ITC Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
2000	A	`conf`	Deception by design: fooling ourselves with gate-level models. ITC Peter C. Maxwell, Jeff Rearick
1999	A	`conf`	Current ratios: a self-scaling technique for production I_DDQ testing. ITC Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
1998	Misc	`conf`	Best Methods for At-Speed Testing? VTS Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh
1998	A	`conf`	CMOS IC reliability indicators and burn-in economics. ITC Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell
1998	A	`conf`	Estimation of defect-free IDDQ in submicron circuits using switch level simulation. ITC Peter C. Maxwell, Jeff Rearick
1997	Misc	`conf`	An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
1997	A	`conf`	So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
1996	A	`conf`	I ITC Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown
1995	J	`jnl`	Reductions in quality caused by uneven fault coverage of different areas of an integrated circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Peter C. Maxwell
1995	A	`conf`	The Many Faces of Test Synthesis. ITC Peter C. Maxwell
1995	Misc	`conf`	The use of IDDQ testing in low stuck-at coverage situations. VTS Peter C. Maxwell
1994	Misc	`conf`	Quality impacts of non-uniform fault coverage. VTS Peter C. Maxwell
1994	A	`conf`	The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. ITC Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman
1993	A	`conf`	Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. ITC Peter C. Maxwell, Robert C. Aitken
1993	A	`conf`	Let's Grade ALL the Faults. ITC Peter C. Maxwell
1993	J	`jnl`	Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. IEEE Des. Test Comput. Peter C. Maxwell, Robert C. Aitken
1992	J	`jnl`	IDDQ testing as a component of a test suite: The need for several fault coverage metrics. J. Electron. Test. Peter C. Maxwell, Robert C. Aitken
1992	A	`conf`	The Effectiveness of I ITC Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang
1991	A	`conf`	The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? ITC Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang
1991	A	`conf`	The Interaction of Test and Quality. ITC Peter C. Maxwell
1990	—	`conf`	The effectiveness of different test sets for PLAs. EURO-DAC Peter C. Maxwell, Hans-Joachim Wunderlich
1988	J	`jnl`	Comparative Analysis of Different Implementations of Multiple-Input Signature Analyzers. IEEE Trans. Computers Peter C. Maxwell
1978	J	`jnl`	Comments on "A Floating Point Multiplexed DDA System". IEEE Trans. Computers Philip G. McCrea, Peter C. Maxwell, Paul W. Baker
1977	J	`jnl`	Correct DDA Register Transfers for Trapezoidal Integration When Solving Nonlinear Equations of the Form IEEE Trans. Computers Peter C. Maxwell
1976	J	`jnl`	Incremental Computer Systems. Aust. Comput. J. Peter C. Maxwell, Paul W. Baker, Philip G. McCrea
1974	J	`jnl`	Alternative Descriptions in Line Drawing Analysis. Artif. Intell. Peter C. Maxwell