Peter Bendix

13 papers A 1C 1Journal 2Unranked 9
YearRankTypeTitle / Venue / Authors
2005 — conf
ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited.
IWSOC
Yoon Huh, Peter Bendix, Kyungjin Min, Jau-Wen Chen, Ravindra Narayan, Larry D. Johnson, Steven H. Voldman
2004 — conf
Advanced compact models: gateway to modern CMOS design.
ICECS
Gennady Gildenblat, Colin C. McAndrew, Hailing Wang, Weimin Wu, Daniel Foty, Laurent Lemaitre, Peter Bendix
2004 J jnl
Design of ESD power protection with diode structures for mixed-power supply systems.
IEEE J. Solid State Circuits
Jaesik Lee, Yoonjong Huh, Peter Bendix, Sung-Mo Kang
2004 — conf
Practical aspects of MOS transistor model "accuracy" in modern CMOS technology.
ICECS
Peter Bendix, Daniel Foty, David Pachura
2004 — conf
Prediction of interconnect adjacency distribution: derivation, validation, and applications.
SLIP
Payman Zarkesh-Ha, Ken Doniger, William Loh, Peter Bendix
2004 — conf
RF distortion analysis with compact MOSFET models.
CICC
Peter Bendix, Pat Rakers, P. Wagh, Laurent Lemaitre, Wladek Grabinski, Colin C. McAndrew, Xin Gu, Gennady Gildenblat
2003 A conf
A Sum-over-Paths Impulse-Response Moment-Extraction Algorithm for IC-Interconnect Networks: Verification, Coupled RC Lines.
ICCAD
Yannick L. Le Coz, Dhivya Krishna, Dusan M. Petranovic, William M. Loh, Peter Bendix
2003 J jnl
Chip-level charged-device modeling and simulation in CMOS integrated circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jaesik Lee, Ki-Wook Kim, Yoonjong Huh, Peter Bendix, Sung-Mo Kang
2001 — conf
Design-for-ESD-reliability for high-frequency I/O interface circuits in deep-submicron CMOS technology.
ISCAS (4)
Jaesik Lee, Yoonjong Huh, Peter Bendix, Sung-Mo Kang
2001 — conf
ESD design rule checker.
ISCAS (5)
Q. Li, Yoonjong Huh, Jau-Wen Chen, Peter Bendix, Sung-Mo Kang
2001 — conf
Full chip ESD design rule checking.
ISCAS (5)
Q. Li, Yoonjong Huh, Jau-Wen Chen, Peter Bendix, Sung-Mo Kang
2001 — conf
Spice Model Quality: Process Development Viewpoint.
ISQED
Peter Bendix
2001 C conf
Understanding and Addressing the Noise Induced By Electrostatic Discharge in Multiple Power Supply Systems.
ICCD
Jaesik Lee, Yoonjong Huh, Peter Bendix, Sung-Mo Kang