| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | — | conf |
MLIC
|
| 2025 | J | jnl |
IET Comput. Vis.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2024 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Appl. Soft Comput.
|
| 2021 | — | conf |
CAA SAFEPROCESS
|
| 2021 | — | conf |
CAA SAFEPROCESS
|
| 2020 | J | jnl |
WIREs Data Mining Knowl. Discov.
|
| 2020 | J | jnl |
Appl. Soft Comput.
|
| 2020 | J | jnl |
Sensors
|
| 2015 | J | jnl |
Int. J. Model. Identif. Control.
|