Pawel Janus

11 papers Journal 6Unranked 5
YearRankTypeTitle / Venue / Authors
2020 — conf
Multichannel Programmable Readout IC for Photodiodes Array.
MIXDES
Pawel Pienczuk, Cezary Kolacinski, Andrzej Szymanski, Pawel Janus, Krzysztof Kucharski, Dariusz Obrebski, Michal Zbiec, Mariusz Jakubowski
2018 — conf
Determining Parameters of the Dual-Phase-Lag Model of Heat Flow.
MIXDES
Mariusz Zubert, Tomasz Raszkowski, Jedrzej Topilko, Lukasz Starzak, Grzegorz Jablonski, Pawel Janus, Marcin Janicki, Andrzej Napieralski
2017 J jnl
SLO-aware Colocation of Data Center Tasks Based on Instantaneous Processor Requirements.
CoRR
Pawel Janus, Krzysztof Rzadca
2017 — conf
SLO-aware colocation of data center tasks based on instantaneous processor requirements.
SoCC
Pawel Janus, Krzysztof Rzadca
2016 — conf
New approach for a multi-cantilever arrays sensor system with advanced MOEMS readout.
ESSDERC
Francesco Ivaldi, Tomasz Bieniek, Pawel Janus, Jerzy Zajac, Piotr Grabiec, Wojciech Majstrzyk, D. Kopiec, Teodor P. Gotszalk
2013 — conf
Dedicated MEMS-based test structure for 3D SiP interconnects reliability investigation.
3DIC
Tomasz Bieniek, Grzegorz Janczyk, Rafal Dobrowolski, Dariusz Szmigiel, Magdalena Ekwinska, Piotr Grabiec, Pawel Janus, Jerzy Zajac
2012 J jnl
Characterization of fatigued Al lines by means of SThM and XRD: Analysis using fast Fourier transform.
Microelectron. Reliab.
R. F. Szeloch, Pawel Janus, Jaroslaw Serafinczuk, P. M. Szecówka, Grzegorz Józwiak
2011 J jnl
Determination of electrical and mechanical parameters in capacitive MEMS accelerometers using electrical measurements.
Microelectron. Reliab.
Stanislaw Kalicinski, Tomasz Bieniek, Pawel Janus, Piotr Grabiec
2011 J jnl
Extraction of elastic-plastic material properties of thin films through nanoindentaion technique with support of numerical methods.
Microelectron. Reliab.
Lukasz Dowhan, Artur Wymyslowski, Pawel Janus, Magdalena Ekwinska, Olaf Wittler
2011 J jnl
Numerical prototyping methods in microsystem accelerometers design.
Microelectron. Reliab.
Lukasz Dowhan, Artur Wymyslowski, Stanislaw Kalicinski, Pawel Janus
2002 J jnl
Scanning Thermal Microscopy in Microsystem Reliability Analysis.
Microelectron. Reliab.
R. F. Szeloch, Teodor P. Gotszalk, Pawel Janus