Paula Diaz Reigosa

11 papers C 1Journal 10
YearRankTypeTitle / Venue / Authors
2018 J jnl
Effect of short-circuit stress on the degradation of the SiO
Microelectron. Reliab.
Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli
2018 J jnl
Impact of meteorological variations on the lifetime of grid-connected PV inverters.
Microelectron. Reliab.
E. M. S. Brito, Allan Fagner Cupertino, Paula Diaz Reigosa, Yongheng Yang, Victor Flores Mendes, Heverton Augusto Pereira
2018 J jnl
Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules.
Microelectron. Reliab.
H. Du, Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli
2018 J jnl
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition.
Microelectron. Reliab.
Haoze Luo, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg
2018 J jnl
Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions.
Microelectron. Reliab.
Mohsen Akbari, Amir Sajjad Bahman, Paula Diaz Reigosa, Francesco Iannuzzo, Mohammad Tavakoli Bina
2017 J jnl
A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis.
Microelectron. Reliab.
Lorenzo Ceccarelli, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg
2017 J jnl
Capacitive effects in IGBTs limiting their reliability under short circuit.
Microelectron. Reliab.
Paula Diaz Reigosa, Francesco Iannuzzo, Munaf Rahimo, Frede Blaabjerg
2017 C conf
Compact electro-thermal modeling of a SiC MOSFET power module under short-circuit conditions.
IECON
Lorenzo Ceccarelli, Paula Diaz Reigosa, Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg
2016 J jnl
Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT.
Microelectron. Reliab.
Paula Diaz Reigosa, Daniel Prindle, Gontran Pâques, Silvan Geissmann, Francesco Iannuzzo, Arnost Kopta, Munaf Rahimo
2016 J jnl
Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview.
Microelectron. Reliab.
Haoze Luo, Francesco Iannuzzo, Paula Diaz Reigosa, Frede Blaabjerg, Wuhua Li, Xiangning He
2015 J jnl
Robustness of MW-Level IGBT modules against gate oscillations under short circuit events.
Microelectron. Reliab.
Paula Diaz Reigosa, Rui Wu, Francesco Iannuzzo, Frede Blaabjerg