| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | — | conf |
MECO
|
| 2025 | C | conf |
ISNCC
|
| 2024 | — | conf |
I2MTC
|
| 2024 | — | conf |
I2MTC
|
| 2024 | — | conf |
I2MTC
|
| 2023 | — | conf |
I2MTC
|
| 2023 | — | conf |
CIVEMSA
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | — | conf |
I2MTC
|
| 2023 | C | conf |
IECON
|
| 2022 | — | conf |
ICPS
|
| 2022 | — | conf |
I2MTC
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | — | conf |
I2MTC
|
| 2022 | C | conf |
IECON
|
| 2021 | — | conf |
I2MTC
|
| 2021 | — | conf |
I2MTC
|
| 2020 | B | conf |
IDA
|
| 2020 | J | jnl |
Comput. Ind.
|
| 2019 | J | jnl |
CoRR
|
| 2019 | — | conf |
I2MTC
|
| 2019 | — | conf |
ICPS
|
| 2019 | J | jnl |
CoRR
|
| 2018 | J | jnl |
CoRR
|
| 2018 | — | conf |
I2MTC
|
| 2018 | — | conf |
I2MTC
|
| 2018 | — | conf |
TPNC
|
| 2017 | — | conf |
I2MTC
|
| 2017 | — | conf |
I2MTC
|
| 2017 | — | conf |
I2MTC
|
| 2017 | B | conf |
GLOBECOM
|
| 2016 | — | conf |
I2MTC
|
| 2016 | — | conf |
I2MTC
|
| 2016 | — | conf |
I2MTC
|
| 2015 | — | conf |
HPCC/CSS/ICESS
|
| 2015 | — | conf |
I2MTC
|
| 2015 | — | conf |
I2MTC
|
| 2015 | — | conf |
I2MTC
|
| 2015 | J | jnl |
J. Math. Imaging Vis.
|
| 2015 | — | conf |
I2MTC
|
| 2015 | — | conf |
SENSORNETS
|
| 2015 | J | jnl |
J. Comput. Phys.
|
| 2014 | J | jnl |
CoRR
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2014 | J | jnl |
Int. J. Hybrid Intell. Syst.
|
| 2014 | J | jnl |
Instrumentation and Surface Modeling for the Measurement of Disks, Circular- and Cylindrical-Strips.
IEEE Trans. Instrum. Meas.
|
| 2014 | — | conf |
I2MTC
|
| 2014 | — | conf |
I2MTC
|
| 2014 | — | conf |
CIVEMSA
|
| 2014 | — | conf |
ICCPS
|
| 2013 | J | jnl |
Comput. Ind.
|
| 2013 | — | conf |
I2MTC
|
| 2013 | — | conf |
I2MTC
|
| 2013 | — | conf |
Image Processing: Machine Vision Applications
|
| 2013 | — | conf |
SENSORNETS
|
| 2013 | — | conf |
Image Processing: Machine Vision Applications
|
| 2012 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2012 | J | jnl |
J. Electronic Imaging
|
| 2012 | — | conf |
Image Processing: Machine Vision Applications
|
| 2011 | — | conf |
Image Processing: Machine Vision Applications
|
| 2011 | A* | conf |
CVPR
|
| 2010 | J | jnl |
J. Electronic Imaging
|
| 2010 | J | jnl |
J. Electronic Imaging
|
| 2009 | J | jnl |
J. Electronic Imaging
|
| 2008 | — | conf |
ICVGIP
|
| 2008 | J | jnl |
Image Vis. Comput.
|
| 2008 | A* | conf |
CVPR
|
| 2008 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2007 | J | jnl |
Image Vis. Comput.
|
| 2006 | — | conf |
ICVGIP
|
| 2006 | A | conf |
BMVC
|
| 2005 | A | conf |
BMVC
|
| 2005 | — | conf |
Computational Imaging
|
| 2005 | J | jnl |
Comput. Ind.
|
| 2004 | A | conf |
BMVC
|
| 2004 | J | jnl |
J. Electronic Imaging
|
| 2004 | — | conf |
ICVGIP
|
| 2004 | J | jnl |
J. Electronic Imaging
|
| 2004 | — | conf |
ICIAR (2)
|
| 2003 | J | jnl |
Pattern Recognit. Lett.
|
| 2002 | J | jnl |
EURASIP J. Adv. Signal Process.
|
| 2001 | C | conf |
CAIP
|
| 1996 | J | jnl |
J. Am. Soc. Inf. Sci.
|
| 1994 | J | jnl |
IEEE J. Solid State Circuits
|
| 1991 | J | jnl |
IEEE Trans. Commun.
|
| 1991 | J | jnl |
IEEE J. Solid State Circuits
|
| 1991 | J | jnl |
IEEE Trans. Commun.
|
| 1989 | J | jnl |
IEEE J. Solid State Circuits
|
| 1988 | J | jnl |
IEEE J. Solid State Circuits
|