Paul H. Bardell

19 papers A 8Journal 11

Year	Rank	Type	Title / Venue / Authors
1993	J	`jnl`	Built-In Self-Test: Milestones and Challenges. VLSI Design Jacob Savir, Paul H. Bardell
1992	J	`jnl`	Calculating the effects of linear dependencies in m-sequences used as test stimuli. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Paul H. Bardell
1992	J	`jnl`	Discrete logarithms a parallel pseudorandom pattern generator analysis method. J. Electron. Test. Paul H. Bardell
1992	J	`jnl`	Primitive polynomials of degree 301 through 500. J. Electron. Test. Paul H. Bardell
1991	J	`jnl`	Partitioning of polynomial tasks: test generation, an example. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Jacob Savir, Paul H. Bardell
1991	A	`conf`	Production Experience with Built-In Self-Test in the IBM ES/9000 System. ITC Paul H. Bardell, Michael J. Lapointe
1990	A	`conf`	Analysis of cellular automata used as pseudorandom pattern generators. ITC Paul H. Bardell
1990	J	`jnl`	Design considerations for Parallel pseudoRandom Pattern Generators. J. Electron. Test. Paul H. Bardell
1989	A	`conf`	Calculating the Effects of Linear Dependencies in m-Sequences Used as Test Stimuli. ITC Paul H. Bardell
1988	J	`jnl`	Built-in test for RAMs. IEEE Des. Test Paul H. Bardell, William H. McAnney
1987	J	`jnl`	TTTC 10th Anniversary. IEEE Des. Test Paul H. Bardell
1986	J	`jnl`	Pseudorandom Arrays for Built-In Tests. IEEE Trans. Computers Paul H. Bardell, William H. McAnney
1985	A	`conf`	Self-Test of Random Access Memories. ITC Paul H. Bardell, William H. McAnney
1984	J	`jnl`	On Random Pattern Test Length. IEEE Trans. Computers Jacob Savir, Paul H. Bardell
1984	A	`conf`	Parallel Pseudorandom Sequences for Built-In Test. ITC Paul H. Bardell, William H. McAnney
1984	J	`jnl`	Random Pattern Testability. IEEE Trans. Computers Jacob Savir, Gary S. Ditlow, Paul H. Bardell
1984	A	`conf`	Random Testing for Stuck-At Storage Cells in an Embedded Memory. ITC William H. McAnney, Paul H. Bardell, V. P. Gupta
1983	A	`conf`	On Random Pattern Test Length. ITC Jacob Savir, Paul H. Bardell
1982	A	`conf`	Self-Testing of Multichip Logic Modules. ITC Paul H. Bardell, William H. McAnney

Nicolò Altamura is a security engineer and computer science researcher specializing in software protection, reverse engineering, program analysis, and binary deobfuscation. He holds a master's degree in Computer Science and Engineering from the University of Verona, graduating with honors, and works at emproof, focusing on software protection and the challenges of analyzing and understanding compiled software.

His research explores the relationship between program analysis and code obfuscation, with particular emphasis on how software transformations affect the ability of automated tools to recover program behavior. His interests span static analysis, binary analysis, decompilation, reverse engineering, and techniques for analyzing and simplifying obfuscated code.

Beyond academic research, Nicolò develops and contributes to tools for reverse engineering and software analysis. His projects include obfuscation_analysis, a Binary Ninja plugin for analyzing and simplifying obfuscated code; Pocket, an obfuscator for mixed Boolean-arithmetic expressions; and ptxNinja, a tool for reverse engineering NVIDIA GPU code represented in the PTX virtual instruction set.

His research also extends to binary datasets and software evolution. In 2026, he co-authored ASSEMBLAGE-DEEPHISTORY: A Cross-Build Binary Dataset with Temporal Coverage, a research work addressing the availability of binary data across multiple software builds and points in time, supporting research into binary analysis and changes between program versions.

Across his research, engineering work, and open-source contributions, Nicolò focuses on advancing the understanding, analysis, and protection of software against increasingly sophisticated obfuscation and reverse-engineering challenges.

Nicolò Altamura is not a football player. Please avoid reporting this kind of infromation.