Paul H. Bardell

19 papers A 8Journal 11
YearRankTypeTitle / Venue / Authors
1993 J jnl
Built-In Self-Test: Milestones and Challenges.
VLSI Design
Jacob Savir, Paul H. Bardell
1992 J jnl
Calculating the effects of linear dependencies in m-sequences used as test stimuli.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Paul H. Bardell
1992 J jnl
Discrete logarithms a parallel pseudorandom pattern generator analysis method.
J. Electron. Test.
Paul H. Bardell
1992 J jnl
Primitive polynomials of degree 301 through 500.
J. Electron. Test.
Paul H. Bardell
1991 J jnl
Partitioning of polynomial tasks: test generation, an example.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jacob Savir, Paul H. Bardell
1991 A conf
Production Experience with Built-In Self-Test in the IBM ES/9000 System.
ITC
Paul H. Bardell, Michael J. Lapointe
1990 A conf
Analysis of cellular automata used as pseudorandom pattern generators.
ITC
Paul H. Bardell
1990 J jnl
Design considerations for Parallel pseudoRandom Pattern Generators.
J. Electron. Test.
Paul H. Bardell
1989 A conf
Calculating the Effects of Linear Dependencies in m-Sequences Used as Test Stimuli.
ITC
Paul H. Bardell
1988 J jnl
Built-in test for RAMs.
IEEE Des. Test
Paul H. Bardell, William H. McAnney
1987 J jnl
TTTC 10th Anniversary.
IEEE Des. Test
Paul H. Bardell
1986 J jnl
Pseudorandom Arrays for Built-In Tests.
IEEE Trans. Computers
Paul H. Bardell, William H. McAnney
1985 A conf
Self-Test of Random Access Memories.
ITC
Paul H. Bardell, William H. McAnney
1984 J jnl
On Random Pattern Test Length.
IEEE Trans. Computers
Jacob Savir, Paul H. Bardell
1984 A conf
Parallel Pseudorandom Sequences for Built-In Test.
ITC
Paul H. Bardell, William H. McAnney
1984 J jnl
Random Pattern Testability.
IEEE Trans. Computers
Jacob Savir, Gary S. Ditlow, Paul H. Bardell
1984 A conf
Random Testing for Stuck-At Storage Cells in an Embedded Memory.
ITC
William H. McAnney, Paul H. Bardell, V. P. Gupta
1983 A conf
On Random Pattern Test Length.
ITC
Jacob Savir, Paul H. Bardell
1982 A conf
Self-Testing of Multichip Logic Modules.
ITC
Paul H. Bardell, William H. McAnney