Patrick Tounsi

16 papers Journal 11Unranked 5

Year	Rank	Type	Title / Venue / Authors
2019	—	`conf`	Detecting PCB Assembly Defects Using Infrared Thermal Signatures. MIXDES Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard
2019	—	`conf`	Development of SiC MOSFET Electrical Model and Experimental Validation: Improvement and Reduction of Parameter Number. MIXDES Quang Chuc Nguyen, Patrick Tounsi, Jean-Pierre Fradin, Jean-Michel Reynes
2019	—	`conf`	Using Compact Thermal Modelling for the Investigation of a Cooling System Dysfunction Applied to a Power Module with Double Sided Cooling. MIXDES Anaïs Cassou, Patrick Tounsi, Jean-Pierre Fradin
2018	J	`jnl`	New defect detection approach using near electromagnetic field probing of high density PCBAs. Microelectron. Reliab. Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard
2018	—	`conf`	New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. NATW Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard
2018	J	`jnl`	Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis. J. Electron. Test. Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard
2013	—	`conf`	Distributed electrothermal modeling methodology for MOS gated power devices simulations. MIXDES Emmanuel Marcault, Jean-Luc Massol, Patrick Tounsi, Jean-Marie Dorkel
2013	J	`jnl`	Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling. Microelectron. Reliab. Toufik Azoui, Patrick Tounsi, Jean-Marie Dorkel, Jean-Michel Reynes, Jean-Luc Massol, E. Pomes
2012	J	`jnl`	Innovative methodology to extract dynamic compact thermal models: Application to power devices. Microelectron. J. Toufik Azoui, Patrick Tounsi, Jean-Marie Dorkel
2012	J	`jnl`	Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations. Microelectron. Reliab. Emmanuel Marcault, Marie Breil, A. Bourennane, Patrick Tounsi, Jean-Marie Dorkel
2011	J	`jnl`	3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs. Microelectron. Reliab. Toufik Azoui, Patrick Tounsi, Philippe Dupuy, Laurent Guillot, Jean-Marie Dorkel
2008	J	`jnl`	3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET. Microelectron. Reliab. Jean-Baptiste Sauveplane, Patrick Tounsi, Emmanuel Scheid, A. Deram
2008	J	`jnl`	Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications. Microelectron. Reliab. Jean-Luc Fock Sui Too, B. Chauchat, Patrick Austin, Patrick Tounsi, Michel Mermet-Guyennet, Régis Meuret
2007	J	`jnl`	Characterization and modelling of ageing failures on power MOSFET devices. Microelectron. Reliab. B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, Emmanuel Scheid
2005	J	`jnl`	Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectron. Reliab. B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin
2002	J	`jnl`	Characterization method of thermomechanical parameters for microelectronic materials. Microelectron. Reliab. Oliver Perat, Jean-Marie Dorkel, Emmanuel Scheid, Pierre Temple-Boyer, Y. S. Chung, A. Peyre-Lavigne, M. Zecri, Patrick Tounsi