| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2022 | — | — |
|
| 2021 | B | conf |
VMCAI
|
| 2020 | B | conf |
ETS
|
| 2019 | B | conf |
ETS
|
| 2019 | A | conf |
DATE
|
| 2019 | A | conf |
ITC
|
| 2018 | C | conf |
IOLTS
|
| 2018 | Misc | conf |
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver.
VTS
|
| 2018 | B | conf |
ETS
|
| 2017 | Misc | conf |
Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model.
VLSID
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | — | conf |
LATS
|
| 2017 | A | conf |
DATE
|
| 2017 | B | conf |
ETS
|
| 2016 | — | conf |
Haifa Verification Conference
|