| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
CASCADE
|
| 2024 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2022 | J | jnl |
Sensors
|
| 2021 | — | conf |
Exploring flexible and 3D printing technologies for the design of high spatial resolution EM probes.
NEWCAS
|
| 2021 | C | conf |
FDTC
|
| 2020 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2020 | — | conf |
SSD
|
| 2020 | — | conf |
SSD
|
| 2018 | J | jnl |
Sensors
|
| 2018 | C | conf |
VLSI-SoC
|
| 2018 | — | conf |
Mechanical Solution for Out-of-Plane Sensitivity Enhancement of CMOS MEMS Convective Accelerometers.
ICECS
|
| 2018 | A | conf |
DATE
|
| 2017 | C | conf |
ISCAS
|
| 2017 | C | conf |
EDUCON
|
| 2017 | — | conf |
ISVLSI
|
| 2017 | — | conf |
SDD
|
| 2017 | — | conf |
MIXDES
|
| 2017 | — | conf |
ICRC
|
| 2016 | C | conf |
EDUCON
|
| 2016 | — | conf |
EWME
|
| 2016 | — | conf |
PATMOS
|
| 2016 | — | conf |
ICL (1)
|
| 2015 | — | conf |
ISVLSI
|
| 2014 | — | conf |
ITHET
|
| 2014 | J | jnl |
J. Electron. Test.
|
| 2013 | J | jnl |
Microelectron. J.
|
| 2012 | A | conf |
An efficient control variates method for yield estimation of analog circuits based on a local model.
ICCAD
|
| 2012 | — | conf |
LATW
|
| 2012 | — | conf |
DTIS
|
| 2012 | — | conf |
NEWCAS
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2011 | A | conf |
DATE
|
| 2011 | — | conf |
LATW
|
| 2010 | C | conf |
ISCAS
|
| 2010 | — | conf |
LATW
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2009 | J | jnl |
Microelectron. Reliab.
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | J | jnl |
Int. J. Online Eng.
|
| 2009 | J | jnl |
IEEE Trans. Learn. Technol.
|
| 2008 | — | conf |
ISVLSI
|
| 2008 | — | conf |
ISVLSI
|
| 2008 | J | jnl |
VLSI Design
|
| 2008 | C | conf |
DDECS
|
| 2008 | J | jnl |
CoRR
|
| 2008 | J | jnl |
CoRR
|
| 2007 | B | conf |
ETS
|
| 2007 | — | conf |
SBCCI
|
| 2006 | J | jnl |
J. Electron. Test.
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | J | jnl |
Microelectron. Reliab.
|
| 2005 | Misc | conf |
VTS
|
| 2005 | B | conf |
ETS
|
| 2004 | J | jnl |
Microelectron. Reliab.
|
| 2004 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2004 | B | conf |
ETS
|
| 2003 | J | jnl |
IEEE Des. Test Comput.
|
| 2002 | Misc | conf |
VTS
|
| 2002 | A | conf |
DATE
|
| 2002 | J | jnl |
Microelectron. Reliab.
|
| 2002 | — | conf |
LATW
|
| 2001 | C | conf |
VLSI-SOC
|
| 2001 | C | conf |
VLSI-SOC
|
| 2001 | C | conf |
VLSI-SOC
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 1999 | A | conf |
DATE
|
| 1999 | A | conf |
DATE
|