Pascal Fouillat

31 papers C 2Journal 15Unranked 14

Year	Rank	Type	Title / Venue / Authors
2009	J	`jnl`	A CMOS Resizing Methodology for Analog Circuits. IEEE Des. Test Comput. Timothée Levi, Jean Tomas, Noëlle Lewis, Pascal Fouillat
2008	C	`conf`	Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. IOLTS Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco
2008	J	`jnl`	Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely
2006	J	`jnl`	Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectron. Reliab. Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat
2005	C	`conf`	Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu
2005	J	`jnl`	Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
2004	J	`jnl`	Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. Microelectron. Reliab. Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis
2004	J	`jnl`	Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. IEEE Trans. Instrum. Meas. Vincent Pouget, Dean Lewis, Pascal Fouillat
2004	J	`jnl`	Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
2003	J	`jnl`	A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
2003	J	`jnl`	Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectron. Reliab. Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat
2003	J	`jnl`	Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectron. Reliab. Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière
2003	J	`jnl`	Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
2002	—	`conf`	A 4 Gsamples/S with 2-4 GHz Input Bandwidth SIGE Digitizer for Radio Astronomy Applications. SBCCI David Deschans, Jean-Baptiste Bégueret, Yann Deval, Christophe Scarabello, Pascal Fouillat, Guy Montignac, Alain Baudry
2002	—	`conf`	A SiGe 4-Gsps 2-bits digitizer with 2-4 GHz input bandwidth. ICECS David Deschans, Jean-Baptiste Bégueret, Yann Deval, Christophe Scarabello, Pascal Fouillat, Guy Montignac, Alain Baudry
2002	J	`jnl`	A VLSI CMOS delay oriented waveform converter for polyphase frequency synthesizer. IEEE J. Solid State Circuits Anne Spataro, Yann Deval, Jean-Baptiste Bégueret, Pascal Fouillat
2002	—	`conf`	Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. LATW Dean Lewis, Pascal Fouillat, Vincent Pouget
2002	—	`conf`	Laser Utilization for Various Testing Purposes. LATW Pascal Fouillat
2001	—	`conf`	A CMOS VLSI delay oriented waveform converter dedicated to the synthesizer of an UMTS transceiver. CICC Anne Spataro, Yann Deval, Jean-Baptiste Bigueret, Pascal Fouillat, Didier Belot
2001	—	`conf`	A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat
2001	—	`conf`	Clock generator using factorial DLL for video applications. CICC Jean-Baptiste Bégueret, Yann Deval, Olivier Mazouffre, Anne Spataro, Pascal Fouillat, Eric Benoit, Jean Mendoza
2001	J	`jnl`	Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu
2001	—	`conf`	Phase error determination in GMSK modulated fractional-N PLL. ICECS L. Camino, Serge Ramet, Jean-Baptiste Bégueret, Yann Deval, Pascal Fouillat
2001	J	`jnl`	Theoretical Investigation of an Equivalent Laser LET. Microelectron. Reliab. Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner
2000	—	`conf`	An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet
2000	—	`conf`	Delay oriented design methodology: application to the design of a VHF low power VLSI polyphase oscillator. ICECS Anne Spataro, Yann Deval, Jean-Baptiste Bégueret, Pascal Fouillat
2000	—	`conf`	Toward Analog Circuit Synthesis: A Global Methodology Based upon Design of Experiments. SBCCI Yann Deval, Jean-Baptiste Bégueret, Jean Tomas, Pascal Fouillat
1999	—	`conf`	A New Industrial Approach Compatible With Microelectronics Education: Application to an RF System Design. MSE Jean Tomas, Yann Deval, Jean-Baptiste Bégueret, Pascal Fouillat, J. L. Aucouturier
1999	—	`conf`	Hierarchical Analogue Design and Behavioural Modelling. MSE Thomas Zimmer, Noëlle Milet-Lewis, Ahmed Fakhfakh, B. Ardouin, Hervé Levi, J. B. Duluc, Pascal Fouillat
1999	J	`jnl`	Using artificial neural networks or Lagrange interpolation to characterize the faults in an analog circuit: an experimental study. IEEE Trans. Instrum. Meas. Yvan Maiden, Barrie W. Jervis, Pascal Fouillat, S. Lesage
1997	—	`conf`	Design, integration and characterization of analog integrated circuits: a complete design flow dedicated to microelectronics education. MSE Jean Tomas, Yann Deval, Pascal Fouillat, E. Ragbi, Jean Paul Dom, J. L. Aucouturier