| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Integr.
|
| 2020 | — | conf |
ISDCS
|
| 2019 | — | conf |
ISDCS
|
| 2019 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2019 | — | conf |
ISDCS
|
| 2018 | — | conf |
IEEE SENSORS
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
J. Circuits Syst. Comput.
|
| 2014 | J | jnl |
IET Circuits Devices Syst.
|
| 2013 | J | jnl |
J. Low Power Electron.
|
| 2013 | A | conf |
ICST
|
| 2013 | A | conf |
ICST
|
| 2013 | — | conf |
ISED
|
| 2012 | — | conf |
VDAT
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | — | conf |
ISED
|
| 2008 | J | jnl |
Microelectron. Reliab.
|