| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2009 | J | jnl |
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention.
Microelectron. Reliab.
|
| 2008 | J | jnl |
Microelectron. Reliab.
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2005 | J | jnl |
Microelectron. Reliab.
|
| 2004 | J | jnl |
Microelectron. Reliab.
|
| 1990 | J | jnl |
Eur. Trans. Telecommun.
|