Paolo Spirito

12 papers Journal 12
YearRankTypeTitle / Venue / Authors
2012 J jnl
3D electro-thermal simulations of wide area power devices operating in avalanche condition.
Microelectron. Reliab.
Michele Riccio, Giuseppe De Falco, Luca Maresca, Giovanni Breglio, Ettore Napoli, Andrea Irace, Yohei Iwahashi, Paolo Spirito
2012 J jnl
An Experimental Power-Lines Model for Digital ASICs Based on Transmission Lines.
IEEE Trans. Very Large Scale Integr. Syst.
Maurizio Costagliola, Davide De Caro, Antonio Girardi, Roberto Izzi, Niccolò Rinaldi, Marco Spirito, Paolo Spirito
2010 J jnl
A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing.
Microelectron. Reliab.
Lucio Rossi, Michele Riccio, Ettore Napoli, Andrea Irace, Giovanni Breglio, Paolo Spirito
2010 J jnl
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography.
Microelectron. Reliab.
Michele Riccio, Lucio Rossi, Andrea Irace, Ettore Napoli, Giovanni Breglio, Paolo Spirito, Ryuzo Tagami, Yoshihito Mizuno
2009 J jnl
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention.
Microelectron. Reliab.
Lucio Rossi, Michele Riccio, Ettore Napoli, Andrea Irace, Giovanni Breglio, Paolo Spirito
2008 J jnl
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography.
Microelectron. Reliab.
Giovanni Breglio, Andrea Irace, Ettore Napoli, Michele Riccio, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta
2007 J jnl
New developments of THERMOS
Microelectron. Reliab.
Andrea Irace, Giovanni Breglio, Paolo Spirito
2007 J jnl
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell.
Microelectron. Reliab.
Giovanni Breglio, Andrea Irace, Ettore Napoli, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta
2006 J jnl
Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode.
Microelectron. Reliab.
Andrea Irace, Giovanni Breglio, Paolo Spirito, A. Bricconi, Diego Raffo, Luigi Merlin
2005 J jnl
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation.
Microelectron. Reliab.
Andrea Irace, Giovanni Breglio, Paolo Spirito, Romeo Letor, Sebastiano Russo
2004 J jnl
Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching.
Microelectron. Reliab.
E. D'Arcangelo, Andrea Irace, Giovanni Breglio, Paolo Spirito
1990 J jnl
A new test structure for recombination measurements in thin si layers for VLSI structures.
Eur. Trans. Telecommun.
Salvatore Bellone, Paolo Spirito