Paolo Magnone

15 papers C 2Journal 12Unranked 1
YearRankTypeTitle / Venue / Authors
2023 J jnl
Experimental analysis of variability in WS
CoRR
Massimo Vatalaro, H. Neill, F. Gity, Paolo Magnone, Vincenzo Maccaronio, C. Márquez, J. C. Galdon, F. Gamiz, Felice Crupi, P. Hurley, Raffaele De Rose
2020 J jnl
Performance improvement of pulse width-amplitude modulation-based quasi-Z-source inverters: Analysis and implementation.
Int. J. Circuit Theory Appl.
Mohammad Mohammadi, Afshin Mirzaee, Paolo Magnone, Javad Shokrollahi Moghani, Paolo Mattavelli
2020 J jnl
Suppression of Second-Order Harmonic Current for Droop-Controlled Distributed Energy Resource Converters in DC Microgrids.
IEEE Trans. Ind. Electron.
Guangyuan Liu, Tommaso Caldognetto, Paolo Mattavelli, Paolo Magnone
2018 J jnl
Investigation of degradation mechanisms in low-voltage p-channel power MOSFETs under High Temperature Gate Bias stress.
Microelectron. Reliab.
Paolo Magnone, Giacomo Barletta, A. Magrì
2018 — conf
Plug and Play DC-DC Converters for Smart DC Nanogrids with Advanced Control Ancillary Services.
CAMAD
Guangyuan Liu, Aram Khodamoradi, Paolo Mattavelli, Tommaso Caldognetto, Paolo Magnone
2017 J jnl
Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide.
Microelectron. Reliab.
Andrea Natale Tallarico, Susanna Reggiani, Paolo Magnone, Giuseppe Croce, Riccardo Depetro, P. Gattari, Enrico Sangiorgi, Claudio Fiegna
2012 J jnl
A methodology to account for the finger interruptions in solar cell performance.
Microelectron. Reliab.
Raffaele De Rose, Antonio Malomo, Paolo Magnone, Felice Crupi, Giorgio Cellere, Marco Martire, Diego Tonini, Enrico Sangiorgi
2012 J jnl
Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling.
IEEE Trans. Very Large Scale Integr. Syst.
Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann
2012 J jnl
Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold Logic Circuits From Device Measurements.
IEEE Trans. Circuits Syst. II Express Briefs
Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Mitsuhiro Togo, N. Horiguchi, Guido Groeseneken
2011 C conf
Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling.
ISCAS
Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann
2011 J jnl
Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements.
IEEE Trans. Very Large Scale Integr. Syst.
Paolo Magnone, Felice Crupi, Massimo Alioto, Ben Kaczer, Brice De Jaeger
2010 C conf
Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits.
ISCAS
Paolo Magnone, Felice Crupi, Massimo Alioto, Ben Kaczer
2009 J jnl
Full Model and Characterization of Noise in Operational Amplifier.
IEEE Trans. Circuits Syst. I Regul. Pap.
Gino Giusi, Felice Crupi, Calogero Pace, Paolo Magnone
2007 J jnl
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks.
Microelectron. Reliab.
Paolo Srinivasan, Felice Crupi, Eddy Simoen, Paolo Magnone, Calogero Pace, Durga Misra, Cor Claeys
2007 J jnl
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics.
Microelectron. Reliab.
Paolo Magnone, Calogero Pace, Felice Crupi, Gino Giusi