Paolo Bernardi

165 papers A 20B 15C 31Misc 7Journal 39Unranked 52

Year	Rank	Type	Title / Venue / Authors
2026	J	`jnl`	A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories. ACM Trans. Embed. Comput. Syst. Paolo Bernardi, Giorgio Insinga, M. Battilana, P. Beer, Giambattista Carnevale, Matteo Coppetta, Nellina Mautone, Alberto Repele, Pierre Scaramuzza, Rudolf Ullmann
2026	J	`jnl`	Netlist-Independent Functional Stress Pattern Generation Strategy for AI HW Accelerators Embedded into SoCs. IEEE Trans. Computers Gabriele Filipponi, Denis Schwachhofer, Francesco Angione, Claudia Bertani, Simone Corbellini, Nicola Di Gruttola Giardino, Giuseppe Garozzo, Giorgio Insinga, Vincenzo Tancorre, Paolo Bernardi
2025	J	`jnl`	A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs. IEEE Trans. Computers Giusy Iaria, Paolo Bernardi, Claudia Bertani, Lorenzo Cardone, Giuseppe Garozzo, Vincenzo Tancorre
2025	J	`jnl`	A Novel Indirect Methodology Based on Execution Traces for Grading Functional Test Programs. IEEE Trans. Computers Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, Stefano Quer, Claudia Bertani, Vincenzo Tancorre
2025	J	`jnl`	A System-Level Test Methodology for Communication Peripherals in System-on-Chips. IEEE Trans. Computers Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Gabriele Filipponi, Claudia Bertani, Vincenzo Tancorre
2025	J	`jnl`	Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. IEEE Trans. Computers Francesco Angione, Paolo Bernardi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre
2025	—	`conf`	Enhancing Logic Diagnosis of Field Returns Through Logic BIST in Automotive SoCs. LATS Paolo Bernardi, Gabriele Filipponi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre
2025	B	`conf`	European Test Symposium Teams: an Anniversary Snapshot. ETS Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025	J	`jnl`	Evaluating Security Properties in the Execution of Quantum Circuits. CoRR Paolo Bernardi, Antonio Brogi, Gian-Luigi Ferrari, Giuseppe Bisicchia
2025	—	`conf`	Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG. ITC-Asia Alessandro Ciullo, Stephan Eggersglüß, Daniel Tille, Andreas Glowatz, Giusy Iaria, Paolo Bernardi
2025	—	`conf`	HW/SW Co-Design of a Reliable Deep Space System Exploiting Application-Profiled RAM Scrubbing. DFT Nicola Di Gruttola Giardino, Paolo Bernardi, Sabrina Corpino, Fabrizio Stesina
2025	A	`conf`	Late Breaking Results: A Data Compaction Strategy for Extensive Test Flows of Memories Embedded in Automotive SoCs. DATE Paolo Bernardi, B. Borio, Giorgio Insinga, B. Mendicino, M. Battilana, M. Coppetta, N. Mautone, Pierre Scaramuzza, F. Tengler, Rudolf Ullmann
2025	—	`conf`	Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs. LATS Francesco Angione, Paolo Bernardi, Claudia Bertani, Lorenzo Bertetto, Lorenzo Cardone, Nicola Di Gruttola Giardino, Stefano Quer, Vincenzo Tancorre
2025	Misc	`conf`	Special Session: Trustworthy Hardware-AI at the Cloud. VTS Francesco Angione, Paolo Bernardi, Alberto Bosio, Harish Dattatraya Dixit, Salvatore Pappalardo, Annachiara Ruospo, Ernesto Sánchez, Arani Sinha, Vittorio Turco
2025	A	`conf`	System-Level Test techniques for Automotive SoCs. ITC Francesco Angione, Paolo Bernardi, Riccardo Cantoro
2024	—	`conf`	A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements. DTTIS Nima Kolahimahmoudi, Giorgio Insinga, Stefano Roggi, Josef Niederl, Paolo Bernardi
2024	—	`conf`	A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. DFT Nicola Di Gruttola Giardino, Francesco Angione, Paolo Bernardi, Tommaso Foscale, Claudia Bertani, Vincenzo Tancorre
2024	—	`conf`	Exploring trade-offs in multi-site wafer testing. LATS Paolo Bernardi, Lorenzo Cardone, Tommaso Foscale
2024	B	`conf`	Optimizing System-Level Test Program Generation via Genetic Programming. ETS Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian
2023	J	`jnl`	A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
2023	C	`conf`	A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. VLSI-SoC Paolo Bernardi, Giorgio Insinga, Nima Kolahimahmoudi
2023	J	`jnl`	A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. IEEE Access Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
2023	Misc	`conf`	A guided debugger-based fault injection methodology for assessing functional test programs. VTS Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2023	C	`conf`	About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. IOLTS Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2023	C	`conf`	Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. DDECS Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2023	—	`conf`	Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. LATS Paolo Bernardi, Gabriele Filipponi, Tommaso Foscale, Giorgio Insinga
2023	—	`conf`	On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre
2022	—	`conf`	A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2022	—	`conf`	A novel SEU injection setup for Automotive SoC. ISIE Giusy Iaria, Tommaso Foscale, Paolo Bernardi, Luca Presicce, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	B	`conf`	An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ETS Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	A	`conf`	An innovative Strategy to Quickly Grade Functional Test Programs. ITC Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	—	`conf`	Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. DFT Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	B	`conf`	Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. ETS Paolo Bernardi, Giorgio Insinga, G. Paganini, Riccardo Cantoro, P. Beer, M. Coppetta, N. Mautone, G. Carnevale, Pierre Scaramuzza, Rudolf Ullmann
2022	J	`jnl`	Parallel Multithread Analysis of Extremely Large Simulation Traces. IEEE Access Davide Appello, Paolo Bernardi, Andrea Calabrese, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
2022	C	`conf`	Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu
2022	—	`conf`	Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode. IRPS Vincent Huard, Francois Jacquet, Souhir Mhira, Lionel Jure, Olivier Montfort, Mathieu Louvat, L. Zaia, F. Bertrand, E. Acacia, O. Caffin, H. Belhadj, O. Durand, Nils Exibard, Vincent Bonnet, A. Charvier, Paolo Bernardi, Riccardo Cantoro
2022	B	`conf`	Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. ETS Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli
2021	C	`conf`	Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. DDECS Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
2021	J	`jnl`	Exploring the Mysteries of System-Level Test. CoRR Ilia Polian, Jens Anders, Steffen Becker, Paolo Bernardi, Krishnendu Chakrabarty, Nourhan Elhamawy, Matthias Sauer, Adit D. Singh, Matteo Sonza Reorda, Stefan Wagner
2021	—	`conf`	Industrial best practice: cases of study by automotive chip- makers. DFT L. Degli Abbati, Rudolf Ullmann, G. Paganini, M. Coppetta, L. Zaia, Vincent Huard, Olivier Montfort, Riccardo Cantoro, Giorgio Insinga, F. Venini, P. Calao, Paolo Bernardi
2021	—	`conf`	Innovative methods for Burn-In related Stress Metrics Computation. DTIS Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli
2021	C	`conf`	System-Level Test: State of the Art and Challenges. IOLTS Davide Appello, H. H. Chen, Matthias Sauer, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda
2020	C	`conf`	Applicative System Level Test introduction to Increase Confidence on Screening Quality. DDECS Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali
2020	—	`conf`	Exploring the Mysteries of System-Level Test. ATS Ilia Polian, Jens Anders, Steffen Becker, Paolo Bernardi, Krishnendu Chakrabarty, Nourhan Elhamawy, Matthias Sauer, Adit D. Singh, Matteo Sonza Reorda, Stefan Wagner
2020	J	`jnl`	Software-Based Self-Test Techniques for Dual-Issue Embedded Processors. IEEE Trans. Emerg. Top. Comput. Paolo Bernardi, Riccardo Cantoro, Sergio de Luca, Ernesto Sánchez, Alessandro Sansonetti, Giovanni Squillero
2019	—	`conf`	A Hybrid In-Field Self-Test Technique for SoCs. DTIS Sara Carbonara, Paolo Bernardi, Marco Restifo
2019	B	`conf`	A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. ETS A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, M. Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi
2019	—	`conf`	A Reliability Analysis of a Deep Neural Network. LATS Alberto Bosio, Paolo Bernardi, Annachiara Ruospo, Ernesto Sánchez
2019	C	`conf`	Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. DDECS F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi
2019	—	`conf`	Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool. LASCAS Paolo Bernardi, Davide Piumatti, Ernesto Sánchez
2019	A	`conf`	Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions. DATE Paolo Bernardi, Riccardo Cantoro, Andrea Floridia, Davide Piumatti, C. Pogonea, Annachiara Ruospo, Ernesto Sánchez, Sergio de Luca, Alessandro Sansonetti
2018	J	`jnl`	Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. J. Electron. Test. Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini
2018	J	`jnl`	An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. J. Low Power Electron. Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini
2018	J	`jnl`	An Optimized Test During Burn-In for Automotive SoC. IEEE Des. Test Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini
2018	J	`jnl`	Scan-Chain Intra-Cell Aware Testing. IEEE Trans. Emerg. Top. Comput. Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda, Etienne Auvray
2017	—	`conf`	A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. LATS Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez, Federico Venini, Davide Appello
2017	A	`conf`	A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. DATE Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini
2017	—	`conf`	An effective fault-injection framework for memory reliability enhancement perspectives. DTIS G. Harcha, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi
2017	J	`jnl`	Microprocessor Testing: Functional Meets Structural Test. J. Circuits Syst. Comput. Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
2017	C	`conf`	On the in-field test of embedded memories. IOLTS Paolo Bernardi, Marco Restifo, Ernesto Sánchez, Matteo Sonza Reorda
2017	C	`conf`	On the in-field testing of spare modules in automotive microprocessors. VLSI-SoC Paolo Bernardi, Sergio de Luca, Davide Piumatti, S. Regis, Ernesto Sánchez, Alessandro Sansonetti
2017	—	`conf`	On-line software-based self-test for ECC of embedded RAM memories. DFT Marco Restifo, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti
2017	C	`conf`	Robustness in automotive electronics: An industrial overview of major concerns. IOLTS Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner
2016	C	`conf`	An effective approach for functional test programs compaction. DDECS Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
2016	J	`jnl`	Development Flow for On-Line Core Self-Test of Automotive Microcontrollers. IEEE Trans. Computers Paolo Bernardi, Riccardo Cantoro, Sergio de Luca, Ernesto Sánchez, Alessandro Sansonetti
2016	C	`conf`	Faster-than-at-speed execution of functional programs: An experimental analysis. VLSI-SoC Paolo Bernardi, Alberto Bosio, Giorgio Di Natale, Andrea Guerriero, Federico Venini
2016	—	`conf`	Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs. VLSI-SoC (Selected Papers) Paolo Bernardi, Alberto Bosio, Giorgio Di Natale, Andrea Guerriero, Ernesto Sánchez, Federico Venini
2016	—	`conf`	Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study. ISVLSI Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
2016	—	`conf`	In-field functional test programs development flow for embedded FPUs. DFT Riccardo Cantoro, Davide Piumatti, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti
2016	Misc	`conf`	Thermal issues in test: An overview of the significant aspects and industrial practice. VTS Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser
2015	—	`conf`	An effective ATPG flow for Gate Delay Faults. DTIS Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
2015	A	`conf`	Exploring the impact of functional test programs re-used for power-aware testing. DATE Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
2015	—	`conf`	SW-based transparent in-field memory testing. LATS Paolo Bernardi, Lyl M. Ciganda Brasca, Matteo Sonza Reorda, Said Hamdioui
2015	—	`conf`	Scan-chain intra-cell defects grading. DTIS Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
2015	B	`conf`	Software-based self-test techniques of computational modules in dual issue embedded processors. ETS Paolo Bernardi, C. Bovi, Riccardo Cantoro, Sergio de Luca, Renato Meregalli, Davide Piumatti, Ernesto Sánchez, Alessandro Sansonetti
2014	—	`conf`	A Comprehensive Evaluation of Functional Programs for Power-Aware Test. NATW Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Paolo Bernardi
2014	A	`conf`	An effective approach to automatic functional processor test generation for small-delay faults. DATE Andreas Riefert, Lyl M. Ciganda, Matthias Sauer, Paolo Bernardi, Matteo Sonza Reorda, Bernd Becker
2014	C	`conf`	An intra-cell defect grading tool. DDECS Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, S. Bernabovi, Paolo Bernardi
2014	J	`jnl`	Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test. J. Electron. Test. Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan
2014	J	`jnl`	MIHST: A Hardware Technique for Embedded Microprocessor Functional On-Line Self-Test. IEEE Trans. Computers Paolo Bernardi, Lyl Mercedes Ciganda, Ernesto Sánchez, Matteo Sonza Reorda
2014	—	`conf`	On the in-field functional testing of decode units in pipelined RISC processors. DFT Paolo Bernardi, Riccardo Cantoro, Lyl M. Ciganda Brasca, Ernesto Sánchez, Matteo Sonza Reorda, Sergio de Luca, Renato Meregalli, Alessandro Sansonetti
2013	—	`conf`	A functional test algorithm for the register forwarding and pipeline interlocking unit in pipelined microprocessors. IDT Paolo Bernardi, D. Boyang, Lyl M. Ciganda, Ernesto Sánchez, Matteo Sonza Reorda, Michelangelo Grosso, Oscar Ballan
2013	C	`conf`	A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors. IOLTS Oscar Ballan, Paolo Bernardi, B. Yazdani, Ernesto Sánchez
2013	—	`conf`	An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase. Asian Test Symposium Paolo Bernardi, Lyl M. Ciganda, Matteo Sonza Reorda, Said Hamdioui
2013	J	`jnl`	Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption. J. Low Power Electron. Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Miroslav Valka, Patrick Girard
2013	C	`conf`	Increasing fault coverage during functional test in the operational phase. IOLTS Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan
2013	—	`conf`	On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors. MTV Paolo Bernardi, Riccardo Cantoro, Lyl M. Ciganda Brasca, Boyang Du, Ernesto Sánchez, Matteo Sonza Reorda, Michelangelo Grosso, Oscar Ballan
2013	A	`conf`	On-line functionally untestable fault identification in embedded processor cores. DATE Paolo Bernardi, Michele Bonazza, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan
2012	C	`conf`	A SBST strategy to test microprocessors' Branch Target Buffer. DDECS Paolo Bernardi, Lyl M. Ciganda, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda
2012	J	`jnl`	An Adaptive Low-Cost Tester Architecture Supporting Embedded Memory Volume Diagnosis. IEEE Trans. Instrum. Meas. Paolo Bernardi, Lyl M. Ciganda
2012	B	`conf`	On-line software-based self-test of the Address Calculation Unit in RISC processors. ETS Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan
2012	—	`conf`	Peak Power Estimation: A Case Study on CPU Cores. Asian Test Symposium Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Patrick Girard, Miroslav Valka
2011	J	`jnl`	A Minimally Invasive Antenna for Microwave Ablation Therapies: Design, Performances, and Experimental Assessment. IEEE Trans. Biomed. Eng. Marta Cavagnaro, Claudio Amabile, Paolo Bernardi, Stefano Pisa, Nevio Tosoratti
2011	—	`conf`	A New Architecture to Cross-Fertilize On-Line and Manufacturing Testing. Asian Test Symposium Paolo Bernardi, Matteo Sonza Reorda
2011	J	`jnl`	A Parallel Tester Architecture for Accelerometer and Gyroscope MEMS Calibration and Test. J. Electron. Test. Lyl M. Ciganda Brasca, Paolo Bernardi, Matteo Sonza Reorda, Dimitri Barbieri, Luciano Bonaria, Roberto Losco, Luciano Marcigot, Maurizio Straiotto
2011	C	`conf`	An effective methodology for on-line testing of embedded microprocessors. IOLTS Paolo Bernardi, Lyl M. Ciganda, Ernesto Sánchez, Matteo Sonza Reorda
2011	A	`conf`	Fault grading of software-based self-test procedures for dependable automotive applications. DATE Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Oscar Ballan
2011	—	`conf`	On the Modeling of Gate Delay Faults by Means of Transition Delay Faults. DFT Paolo Bernardi, Matteo Sonza Reorda, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch
2011	C	`conf`	Optimized embedded memory diagnosis. DDECS Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi
2010	—	`conf`	A Fault Grading Methodology for Software-Based Self-Test Programs in Systems-on-Chip. MTV Oscar Ballan, Paolo Bernardi, Giovanni Fontana, Michelangelo Grosso, Ernesto Sánchez
2010	J	`jnl`	A Hybrid Approach for Detection and Correction of Transient Faults in SoCs. IEEE Trans. Dependable Secur. Comput. Paolo Bernardi, Letícia Maria Veiras Bolzani Poehls, Michelangelo Grosso, Matteo Sonza Reorda
2010	A	`conf`	A programmable BIST for DRAM testing and diagnosis. ITC Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Y. Zhang
2010	A	`conf`	A tester architecture suitable for MEMS calibration and testing. ITC Lyl M. Ciganda Brasca, Paolo Bernardi, Matteo Sonza Reorda, Dimitri Barbieri, Maurizio Straiotto, Luciano Bonaria
2010	—	`conf`	An Enhanced Strategy for Functional Stress Pattern Generation for System-on-Chip Reliability Characterization. MTV Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda
2010	—	`conf`	An Exact and Efficient Critical Path Tracing Algorithm. DELTA Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda
2010	B	`conf`	An adaptive tester architecture for volume diagnosis. ETS Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda
2010	C	`conf`	Cumulative embedded memory failure bitmap display & analysis. DDECS Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone
2010	J	`jnl`	Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug. IET Comput. Digit. Tech. Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2009	C	`conf`	An I-IP based approach for the monitoring of NBTI effects in SoCs. IOLTS C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi
2009	C	`conf`	An efficient fault simulation technique for transition faults in non-scan sequential circuits. DDECS Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda
2009	C	`conf`	An enhanced FPGA-based low-cost tester platform exploiting effective test data compression for SoCs. DDECS Lyl M. Ciganda, Francesco Abate, Paolo Bernardi, M. Bruno, Matteo Sonza Reorda
2009	B	`conf`	Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. ETS Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda
2009	Misc	`conf`	DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda
2009	J	`jnl`	Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. IEEE Trans. Very Large Scale Integr. Syst. Davide Appello, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda
2009	C	`conf`	Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello
2008	—	`conf`	A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores. MTV Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda
2008	Misc	`conf`	A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. VTS Kyriakos Christou, Maria K. Michael, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda
2008	J	`jnl`	An Effective Technique for the Automatic Generation of Diagnosis-Oriented Programs for Processor Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda
2008	B	`conf`	An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. ETS Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso
2008	A	`conf`	An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers. DATE Paolo Bernardi, Matteo Sonza Reorda
2008	—	`conf`	Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors. EvoWorkshops Paolo Bernardi, Kyriakos Christou, Michelangelo Grosso, Maria K. Michael, Ernesto Sánchez, Matteo Sonza Reorda
2008	A	`conf`	Robust Design-for-Productization Practices for High Quality Automotive Products. ITC Paolo Bernardi, Fabio Melchiori, Davide Pandini, Santo Pugliese, Davide Appello
2008	C	`conf`	SoC Symbolic Simulation: a case study on delay fault testing. DDECS Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi
2007	C	`conf`	A Hybrid Approach to Fault Detection and Correction in SoCs. IOLTS Paolo Bernardi, Letícia Maria Veiras Bolzani, Matteo Sonza Reorda
2007	J	`jnl`	A System-layer Infrastructure for SoC Diagnosis. J. Electron. Test. Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2007	B	`conf`	Agri-Food Traceability Management using a RFID System with Privacy Protection. AINA Paolo Bernardi, Claudio Demartini, Filippo Gandino, Bartolomeo Montrucchio, Maurizio Rebaudengo, Erwing Ricardo Sanchez
2007	—	`conf`	An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. DFT Jorge Luis Lagos-Benites, Davide Appello, Paolo Bernardi, Michelangelo Grosso, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda
2007	—	`conf`	An optimized hybrid approach to provide fault detection and correction in SoCs. SBCCI Letícia Maria Veiras Bolzani, Paolo Bernardi, Matteo Sonza Reorda
2007	—	`conf`	Design of an UHF RFID transponder for secure authentication. ACM Great Lakes Symposium on VLSI Paolo Bernardi, Filippo Gandino, Bartolomeo Montrucchio, Maurizio Rebaudengo, Erwing Ricardo Sanchez
2007	C	`conf`	Extended Fault Detection Techniques for Systems-on-Chip. DDECS Paolo Bernardi, Letícia Maria Veiras Bolzani, Matteo Sonza Reorda
2007	—	`conf`	Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems. ACM Great Lakes Symposium on VLSI Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda
2007	B	`conf`	On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. ETS Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda
2007	J	`jnl`	Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study CoRR Paolo Bernardi, Guido Masera, Federico Quaglio, Matteo Sonza Reorda
2006	J	`jnl`	A New Hybrid Fault Detection Technique for Systems-on-a-Chip. IEEE Trans. Computers Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante
2006	Misc	`conf`	A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries. VTS Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2006	B	`conf`	An Evolutionary Methodology to Enhance Processor Software-Based Diagnosis. IEEE Congress on Evolutionary Computation Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda
2006	A	`conf`	An effective technique for minimizing the cost of processor software-based diagnosis in SoCs. DATE Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda
2006	A	`conf`	Embedded Memory Diagnosis: An Industrial Workflow. ITC Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2006	Misc	`conf`	On the Automation of the Test Flow of Complex SoCs. VTS Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2006	—	`conf`	Software-Based On-Line Test of Communication Peripherals in Processor-Based Systems for Automotive Applications. MTV Paolo Bernardi, Letícia Maria Veiras Bolzani, Alberto Manzone, Massimo Osella, Massimo Violante, Matteo Sonza Reorda
2006	J	`jnl`	System-in-Package Testing: Problems and Solutions. IEEE Des. Test Comput. Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda
2006	C	`conf`	Test Considerations about the Structured ASIC Paradigm. DDECS Paolo Bernardi, Michelangelo Grosso
2006	—	`—`	Test techniques for systems-on-a-chip. Paolo Bernardi
2005	—	`conf`	An Integrated Approach for Increasing the Soft-Error Detection Capabilities in SoCs processors. DFT Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante
2005	—	`conf`	Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets. MTV Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero
2005	—	`conf`	Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores. MTV Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2005	B	`conf`	Exploiting an infrastructure IP to reduce memory diagnosis costs in SoCs. ETS Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2005	C	`conf`	Integrating BIST Techniques for On-Line SoC Testing. IOLTS Alberto Manzone, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Ernesto Sánchez, Matteo Sonza Reorda
2005	A	`conf`	On-Line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core. DSN Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante
2004	J	`jnl`	A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electron. Test. Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
2004	A	`conf`	Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA. DATE M. Bellato, Paolo Bernardi, D. Bortolato, A. Candelori, M. Ceschia, Alessandro Paccagnella, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, P. Zambolin
2004	—	`conf`	Exploiting an I-IP for In-Field SOC Test. DFT Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda
2004	C	`conf`	On the Evaluation of SEU Sensitiveness in SRAM-Based FPGAs. IOLTS Paolo Bernardi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante
2004	A	`conf`	Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study. DATE Paolo Bernardi, Guido Masera, Federico Quaglio, Matteo Sonza Reorda
2004	—	`conf`	Using Infrastructure IPs to Support SW-Based Self-Test of Processor Cores. MTV Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda
2003	A	`conf`	A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories. DATE Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante
2003	—	`conf`	An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores. ETFA (1) Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda
2003	C	`conf`	Analyzing SEU Effects in SRAM-based FPGAs. IOLTS Massimo Violante, M. Ceschia, Matteo Sonza Reorda, Alessandro Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori
2003	A	`conf`	Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante
2003	J	`jnl`	Specific absorption rate and temperature elevation in a subject exposed in the far-field of radio-frequency sources operating in the 10-900-MHz range. IEEE Trans. Biomed. Eng. Paolo Bernardi, Marta Cavagnaro, Stefano Pisa, Emanuele Piuzzi
2001	J	`jnl`	A 915-MHz antenna for microwave thermal ablation treatment: physical design, computer modeling and experimental measurement. IEEE Trans. Biomed. Eng. Stefano Pisa, Marta Cavagnaro, Paolo Bernardi, James C. Lin
1997	J	`jnl`	Assessment of the potential risk for humans exposed to millimeter-wave wireless LANs: the power absorbed in the eye. Wirel. Networks Paolo Bernardi, Marta Cavagnaro, Stefano Pisa
1997	J	`jnl`	EMC-oriented full-wave modelling of passive MMIC structures for wireless applications. Ann. des Télécommunications Paolo Bernardi, Renato Cicchetti, Antonio Faraone
1997	J	`jnl`	Editorial: Exposure Hazards and Health Protectionin Personal Communication Services. Wirel. Networks James C. Lin, Paolo Bernardi
1994	J	`jnl`	A generalized ionic model of the neuronal membrane electrical activity. IEEE Trans. Biomed. Eng. Paolo Bernardi, Guglielmo D'Inzeo, Stefano Pisa