Pan Liu

14 papers Journal 8Unranked 6
YearRankTypeTitle / Venue / Authors
2026 J jnl
Algebraic Semantics for Interpretable Reasoning in Large Language Models.
Inf. Sci.
Pan Liu, Yihao Li
2026 J jnl
Less is more: Enhancing parallel fault localization through partial rankings.
J. Syst. Softw.
Yihao Li, Tian Pan, Pan Liu
2025 — conf
EAR: A Unified Modeling Approach for Knowledge Graphs.
QRS Companion
Pan Liu, Tian Pan, Zizhao Chen, Yihao Li
2025 — conf
Evaluating Large Language Models Via Multi-Modal User Knowledge Graphs: A Comprehensive Assessment Framework.
ISSSR
Pan Liu, Zizhao Chen, Yihao Li, W. Eric Wong
2025 J jnl
Evaluating large language models for software testing.
Comput. Stand. Interfaces
Yihao Li, Pan Liu, Haiyang Wang, Jie Chu, W. Eric Wong
2025 J jnl
Hierarchical tree-based algorithms for efficient expression parsing and test sequence generation in software models.
J. Syst. Softw.
Yihao Li, Pan Liu
2025 — conf
Lights, Camera, Adversarial Action! a Study of Role-Playing Prompt Effects on LLM Attack Susceptibility.
DSA
Tian Pan, Mengzhen Tian, Xiao Zhao, Pan Liu, Yihao Li
2025 — conf
Review of Large Language Model-Based Software Fault Localization Techniques.
DSA
Tian Pan, Pan Liu, Yihao Li
2023 J jnl
Alternative Ranking Distance Metrics for Fault-Focused Clustering in Parallel Fault Localization.
Int. J. Perform. Eng.
Yihao Li, Pan Liu, W. Eric Wong, Nicholas Chau, Chih-Wei Hsu
2023 — conf
Global Nuclear Weapons Trends Forecast Via Machine Learning.
ISSSR
Xinlong Zhang, Jingdong Wang, Shao Qi, Pan Liu, Li Li, W. Eric Wong
2023 — conf
Simulation of Online Emotional Public Opinion via Cellular Automata Model.
ISSSR
Xinlong Zhang, Jingdong Wang, Shao Qi, Pan Liu, Li Li
2022 J jnl
A Preliminary Investigation on the Performance of SBFL Techniques and Distance Metrics in Parallel Fault Localization.
IEEE Trans. Reliab.
Yihao Li, Pan Liu
2021 J jnl
Transition Algebra for Software Testing.
IEEE Trans. Reliab.
Pan Liu, Yihao Li, Huaikou Miao
2018 J jnl
MTTool: A Tool for Software Modeling and Test Generation.
IEEE Access
Pan Liu, Zhenning Xu