Pablo Saraza-Canflanca

25 papers A 2Journal 4Unranked 19
YearRankTypeTitle / Venue / Authors
2025 — conf
Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework.
IRPS
Yusuke Higashi, Anirudh Varanasi, Philippe J. Roussel, Pablo Saraza-Canflanca, J. P. Bastos, Alexander Grill, E. Catapano, Ruben Asanovski, Jacopo Franco, Ben Kaczer, Adrian Chasin, Devin Verreck, S. Ramesh, Laurent Breuil, Antonio Arreghini, S. Rachidi, Y. Jeong, Geert Van den Bosch, Maarten Rosmeulen, Robin Degraeve
2025 — conf
Effects of Temperature and Device-to-Device Variability in pFET-Based Bias Temperature Instability Reservoir Computing.
IRPS
Yuanyang Guo, Robin Degraeve, Pablo Saraza-Canflanca, Ben Kaczer, Erik Bury, Ingrid Verbauwhede
2024 — conf
Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology.
IRPS
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Alex Romano-Molar, Erik Bury, Robin Degraeve, Ben Kaczer
2024 — conf
Exploiting Bias Temperature Instability for Reservoir Computing in Edge Artificial Intelligence Applications.
IRPS
Y. Guo, Robin Degraeve, Michiel Vandemaele, Pablo Saraza-Canflanca, Jacopo Franco, Ben Kaczer, Erik Bury, Ingrid Verbauwhede
2024 — conf
Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays.
IRPS
Pablo Saraza-Canflanca, Dishant Sangani, Javier Diaz-Fortuny, Stanislav Tyaginov, Georges G. E. Gielen, Erik Bury, Ben Kaczer
2023 — conf
A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array.
SMACD
Andrés Santana-Andreo, Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2023 — conf
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability.
IRPS
Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría
2023 — conf
Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation.
IRPS
Javier Diaz-Fortuny, Dishant Sangani, Pablo Saraza-Canflanca, Erik Bury, Robin Degraeve, Ben Kaczer
2023 — conf
Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices.
SMACD
Francisco V. Fernández, Elisenda Roca, Pablo Saraza-Canflanca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López
2023 — conf
Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology.
IRPS
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Andrea Vici, Erik Bury, Robin Degraeve, Ben Kaczer
2022 J jnl
A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs.
Integr.
Andrés Santana-Andreo, Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Piedad Brox, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2022 — conf
A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability.
IRPS
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Erik Bury, Michiel Vandemaele, Ben Kaczer, Robin Degraeve
2022 — conf
A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies.
IRPS
Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Andrés Santana-Andreo, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2022 — conf
A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation.
SMACD
Pablo Saraza-Canflanca, Javier Martín-Martínez, Elisenda Roca, Rafael Castro-López, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2022 J jnl
On the Impact of the Biasing History on the Characterization of Random Telegraph Noise.
IEEE Trans. Instrum. Meas.
Pablo Saraza-Canflanca, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2020 J jnl
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level.
Integr.
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2020 J jnl
Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits.
IEEE Trans. Instrum. Meas.
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría
2020 — conf
Improving the reliability of SRAM-based PUFs in the presence of aging.
DTIS
Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Piedad Brox, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2019 — conf
A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices.
IRPS
G. Pedreira, Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría
2019 A conf
Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator.
DATE
Antonio Toro-Frías, Pablo Saraza-Canflanca, Fábio Passos, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2019 A conf
New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors.
DATE
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca Moreno, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2019 — conf
TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level.
SMACD
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2018 — conf
A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation.
SMACD
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Antonio Toro-Frías, Rafael Castro-López, Javier Martín-Martínez, Elisenda Roca, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría
2018 — conf
Automated Massive RTN Characterization Using a Transistor Array Chip.
SMACD
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Antonio Toro-Frías, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2018 — conf
Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models.
SMACD
Pablo Saraza-Canflanca, D. Malagon, Fábio Passos, A. Toro, Juan Núñez, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández