Owain Parry

16 papers A* 1A 2C 1Journal 8Unranked 4
YearRankTypeTitle / Venue / Authors
2025 — conf
Foreword to the 2nd International Flaky Tests Workshop 2025 (FTW 2025).
FTW@ICSE
Martin Gruber, Wing Lam, Owain Parry, August Shi
2025 — conf
QAOA-PCA: Enhancing Efficiency in the Quantum Approximate Optimization Algorithm via Principal Component Analysis.
EASE Companion
Owain Parry, Phil McMinn
2025 J jnl
QAOA-PCA: Enhancing Efficiency in the Quantum Approximate Optimization Algorithm via Principal Component Analysis.
CoRR
Owain Parry, Phil McMinn
2025 J jnl
Summary of the 2nd International Flaky Test Workshop (FTW 2025).
ACM SIGSOFT Softw. Eng. Notes
Martin Gruber, Wing Lam, Owain Parry, August Shi
2025 A conf
Systemic Flakiness: An Empirical Analysis of Co-Occurring Flaky Test Failures.
EASE
Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn
2025 J jnl
Systemic Flakiness: An Empirical Analysis of Co-Occurring Flaky Test Failures.
CoRR
Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn
2024 A* conf
Do Automatic Test Generation Tools Generate Flaky Tests?
ICSE
Martin Gruber, Muhammad Firhard Roslan, Owain Parry, Fabian Scharnböck, Phil McMinn, Gordon Fraser
2024 J jnl
Improving the Reliability of Quantum Circuits by Evolving Heterogeneous Ensembles.
CoRR
Owain Parry, John Clark, Phil McMinn
2024 J jnl
Summary of the 1st International Flaky Test Workshop (FTW 2024).
ACM SIGSOFT Softw. Eng. Notes
Owain Parry, Martin Gruber, Tim A. D. Henderson, Phil McMinn, Gordon Fraser
2023 J jnl
Do Automatic Test Generation Tools Generate Flaky Tests?
CoRR
Martin Gruber, Muhammad Firhard Roslan, Owain Parry, Fabian Scharnböck, Phil McMinn, Gordon Fraser
2023 J jnl
Empirically evaluating flaky test detection techniques combining test case rerunning and machine learning models.
Empir. Softw. Eng.
Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn
2022 J jnl
A Survey of Flaky Tests.
ACM Trans. Softw. Eng. Methodol.
Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn
2022 A conf
Evaluating Features for Machine Learning Detection of Order- and Non-Order-Dependent Flaky Tests.
ICST
Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn
2022 — conf
Surveying the Developer Experience of Flaky Tests.
ICSE (SEIP)
Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn
2022 C conf
What Do Developer-Repaired Flaky Tests Tell Us About the Effectiveness of Automated Flaky Test Detection?
AST
Owain Parry, Michael Hilton, Gregory M. Kapfhammer, Phil McMinn
2020 — conf
Flake It 'Till You Make It: Using Automated Repair to Induce and Fix Latent Test Flakiness.
ICSE (Workshops)
Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn