| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2025 | A | conf |
DATE
|
| 2024 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2024 | B | conf |
ETS
|
| 2024 | J | jnl |
IEEE Trans. Inf. Theory
|
| 2024 | C | conf |
Refinement and Empirical Side-Channel Analysis of Inner Product Masking with Robust Error Detection.
IOLTS
|
| 2024 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2023 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Trans. Computers
|
| 2021 | B | conf |
ETS
|
| 2021 | J | jnl |
J. Cryptogr. Eng.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | — | conf |
CF
|
| 2021 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Inf. Theory
|
| 2020 | J | jnl |
J. Cryptogr. Eng.
|
| 2020 | B | conf |
ETS
|
| 2020 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2020 | C | conf |
ISCAS
|
| 2019 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2019 | — | conf |
CICC
|
| 2019 | — | conf |
PROOFS
|
| 2019 | J | jnl |
Cryptogr. Commun.
|
| 2019 | — | conf |
NTMS
|
| 2019 | — | conf |
NTMS
|
| 2019 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2019 | — | conf |
IVSW
|
| 2019 | — | conf |
IVSW
|
| 2019 | — | conf |
ESSCIRC
|
| 2019 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2019 | J | jnl |
IEEE Embed. Syst. Lett.
|
| 2018 | — | conf |
PROOFS
|
| 2018 | A | conf |
DATE
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | — | conf |
DCIS
|
| 2018 | — | conf |
APCCAS
|
| 2017 | — | conf |
ICMCTA
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | C | conf |
IOLTS
|
| 2017 | — | conf |
ICMCTA
|
| 2017 | J | jnl |
IEEE Trans. Inf. Theory
|
| 2017 | — | conf |
EST
|
| 2016 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2016 | J | jnl |
Dagstuhl Reports
|
| 2015 | J | jnl |
CoRR
|
| 2015 | J | jnl |
IEEE Commun. Lett.
|
| 2015 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2015 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2015 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | J | jnl |
IEEE Trans. Commun.
|
| 2015 | B | conf |
ITW
|
| 2014 | B | conf |
ETS
|
| 2014 | — | conf |
DFT
|
| 2014 | J | jnl |
IEEE Trans. Inf. Theory
|
| 2014 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2013 | J | jnl |
SIAM Rev.
|
| 2013 | J | jnl |
Inf. Secur. J. A Glob. Perspect.
|
| 2013 | J | jnl |
Inf. Secur. J. A Glob. Perspect.
|
| 2012 | — | conf |
DFT
|
| 2012 | C | conf |
IOLTS
|
| 2012 | C | conf |
IOLTS
|
| 2011 | J | jnl |
IEEE Trans. Inf. Theory
|
| 2011 | C | conf |
IOLTS
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | C | conf |
DSD
|
| 2010 | — | conf |
DFT
|
| 2010 | — | conf |
EWDTS
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2009 | C | conf |
IOLTS
|
| 2008 | — | conf |
DFT
|
| 2008 | J | jnl |
IEEE Trans. Computers
|
| 2007 | — | conf |
VLSI-SoC (Selected Papers)
|
| 2007 | C | conf |
VLSI-SoC
|
| 2006 | C | conf |
DSD
|
| 1999 | J | jnl |
IEEE Trans. Inf. Theory
|
| 1998 | J | jnl |
IEEE Trans. Inf. Theory
|
| 1997 | J | jnl |
IEEE Trans. Inf. Theory
|