| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | — | conf |
ITHET
|
| 2022 | — | conf |
ITHET
|
| 2022 | — | conf |
LASCAS
|
| 2021 | — | conf |
Strengths and threats of pervasive information technologies: effect on engineering higher education.
ITHET
|
| 2019 | — | conf |
ITHET
|
| 2018 | — | conf |
ITHET
|
| 2018 | — | conf |
LASCAS
|
| 2017 | — | conf |
ITHET
|
| 2017 | — | conf |
MSE
|
| 2016 | — | conf |
ITHET
|
| 2016 | — | conf |
EWME
|
| 2016 | — | conf |
ITHET
|
| 2015 | — | conf |
ITHET
|
| 2015 | — | conf |
ITHET
|
| 2015 | — | conf |
MSE
|
| 2014 | — | conf |
ITHET
|
| 2014 | — | conf |
EWME
|
| 2014 | — | conf |
EWME
|
| 2013 | — | conf |
MSE
|
| 2012 | — | conf |
ITHET
|
| 2012 | — | conf |
ITHET
|
| 2012 | — | conf |
ITHET
|
| 2003 | J | jnl |
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material.
Microelectron. Reliab.
|
| 2003 | — | conf |
MSE
|
| 2003 | J | jnl |
Microelectron. Reliab.
|
| 2002 | J | jnl |
Microelectron. Reliab.
|
| 2002 | — | conf |
LATW
|
| 2002 | — | conf |
LATW
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 2001 | — | conf |
MSE
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 1999 | — | conf |
MSE
|
| 1999 | — | conf |
MSE
|
| 1997 | — | conf |
MSE
|