Oleg Semenov

17 papers A 1B 2Journal 7Unranked 6
YearRankTypeTitle / Venue / Authors
2014 — ch.
The Effects of Multivalency and Kinetics in Nanoscale Search by Molecular Spiders.
Evolution, Complexity and Artificial Life
Oleg Semenov, Darko Stefanovic, Milan N. Stojanovic
2013 — conf
Catalytic Molecular Walkers: Aspects of Product Release.
ECAL
Darko Stefanovic, Milan N. Stojanovic, Mark J. Olah, Oleg Semenov
2013 J jnl
Cooperative linear cargo transport with molecular spiders.
Nat. Comput.
Oleg Semenov, Mark J. Olah, Darko Stefanovic
2011 J jnl
A Review of PVT Compensation Circuits for Advanced CMOS Technologies.
Circuits Syst.
Andrey Malkov, Dmitry Vasiounin, Oleg Semenov
2011 B conf
Multiple Molecular Spiders with a Single Localized Source - The One-Dimensional Case - (Extended Abstract).
DNA
Oleg Semenov, Mark J. Olah, Darko Stefanovic
2011 — conf
Новые возможности поиска и графического представления информации базы данных по основным параметрам гигантского дипольного резонанса ядер (New Abilities in Search and Graphical Presentation for Information on the Main Parameters of Giant Dipole Resonance of Atomic Nuclei Data Base).
RCDL
Vladimir Varlamov, Ilya Ekhlakov, Sergey Komarov, Nickolay Peskov, Oleg Semenov, Mikhail Ye. Stepanov
2007 — conf
Optimizing Circuit Performance and ESD Protection for High-Speed Differential I/Os.
CICC
Hossein Sarbishaei, Oleg Semenov, Manoj Sachdev
2007 J jnl
Temperature dependence of I
IET Circuits Devices Syst.
Alexei Kaltchenko, Oleg Semenov
2006 J jnl
Novel gate and substrate triggering techniques for deep sub-micron ESD protection devices.
Microelectron. J.
Oleg Semenov, Hossein Sarbishaei, Valery Axelrad, Manoj Sachdev
2006 B conf
Throughput of WLAN Systems with LDPC Codes and Adaptive Bit Loading.
PIMRC
Andrey Belogolovy, Mikhail Yu. Lyakh, Oleg Semenov, Andrei Ovchinnikov
2005 — conf
Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment.
ISQED
Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev
2004 J jnl
Evaluation of STI degradation using temperature dependence of leakage current in parasitic STI MOSFET.
Microelectron. Reliab.
Oleg Semenov, Michael S. Obrecht, Manoj Sachdev
2004 J jnl
The Impact of CMOS technology scaling on MOSFETs second breakdown: Evaluation of ESD robustness.
Microelectron. Reliab.
Oleg Semenov, Hossein Sarbishaei, Valery Axelrad, Manoj Sachdev
2003 A conf
Burn-in Temperature Projections for Deep Sub-micron Technologies.
ITC
Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins
2003 J jnl
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta
J. Electron. Test.
Oleg Semenov, Arman Vassighi, Manoj Sachdev
2003 — conf
Thermal Management of High Performance Microprocessors.
DFT
Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi
2002 — conf
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI.
DFT
Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi