Noriyoshi Itazaki

13 papers A 1Journal 5Unranked 7
YearRankTypeTitle / Venue / Authors
2002 J jnl
Built-in Self-Test for crosstalk faults in a digital VLSI.
Syst. Comput. Jpn.
Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita
2002 — conf
Crosstalk Fault Reduction and Simulation for Clock-Delayed Domino Circuits.
Asian Test Symposium
Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita
2002 — conf
Fault Simulation Method for Crosstalk Faults in Clock-Delayed Domino CMOS Circuits.
DELTA
Kazuya Shimizu, Masaya Takamura, Takanori Shirai, Noriyoshi Itazaki, Kozo Kinoshita
2001 — conf
Built-in Self-Test for State Faults Induced by Crosstalk in Sequential Circuits.
Asian Test Symposium
Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita
1998 — conf
Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA.
Asian Test Symposium
Noriyoshi Itazaki, Fumiro Matsuki, Yasuyuki Matsumoto, Kozo Kinoshita
1997 — conf
An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits.
Asian Test Symposium
Noriyoshi Itazaki, Yasutaka Idomoto, Kozo Kinoshita
1996 — conf
A Fault Simulation Method for Crosstalk Faults in Synchronous Sequential Circuits.
FTCS
Noriyoshi Itazaki, Yasutaka Idomoto, Kozo Kinoshita
1995 J jnl
Test pattern generation for crosstalk faults considering the gate delay.
Syst. Comput. Jpn.
Noriyoshi Itazaki, Kozo Kinoshita, Hisao Naitoh
1994 J jnl
An approach to the analysis and detection of crosstalk faults in digital VLSI circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Antonio Rubio, Noriyoshi Itazaki, Xiaole Xu, Kozo Kinoshita
1991 — conf
An approach to the analysis and test of crosstalk faults in digital VLSI circuits.
EURO-DAC
Antonio Rubio, Noriyoshi Itazaki, Xiaole Xu, Kozo Kinoshita
1991 J jnl
Stuck-open faults test generation for cmos combinational circuits.
Syst. Comput. Jpn.
Seiji Kajihara, Noriyoshi Itazaki, Kozo Kinoshita
1989 J jnl
Test pattern generation for circuits with tri-state modules by Z-algorithm.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Noriyoshi Itazaki, Kozo Kinoshita
1986 A conf
Test Pattern Generation for Circuits with Three-state Modules by Improved Z-algorithm.
ITC
Noriyoshi Itazaki, Kozo Kinoshita