Noriaki Nakayama

16 papers A* 1C 1Journal 9Unranked 5
YearRankTypeTitle / Venue / Authors
2010 C conf
Decomposition of drain-current variation into gain-factor and threshold voltage variations.
ISCAS
Takashi Sato, Takumi Uezono, Noriaki Nakayama, Kazuya Masu
2009 J jnl
Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors.
IEEE J. Solid State Circuits
Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu
2009 J jnl
Physical design challenges to nano-CMOS circuits.
IEICE Electron. Express
Kazuya Masu, Noboru Ishihara, Noriaki Nakayama, Takashi Sato, Shuhei Amakawa
2008 J jnl
An Evaluation Method of the Number of Monte Carlo STA Trials for Statistical Path Delay Analysis.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Masanori Imai, Takashi Sato, Noriaki Nakayama, Kazuya Masu
2008 — conf
Determination of optimal polynomial regression function to decompose on-die systematic and random variations.
ASP-DAC
Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu
2008 J jnl
Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress.
IEICE Trans. Electron.
Kenta Yamada, Takashi Sato, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu, Shigetaka Kumashiro
2008 A* conf
Non-parametric statistical static timing analysis: an SSTA framework for arbitrary distribution.
DAC
Masanori Imai, Takashi Sato, Noriaki Nakayama, Kazuya Masu
2007 — conf
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.
ISQED
Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu
2005 J jnl
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IEICE Trans. Electron.
Shizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama
2005 J jnl
A Compact Model of the Pinch-off Region of 100 nm MOSFETs Based on the Surface-Potential.
IEICE Trans. Electron.
Dondee Navarro, Takeshi Mizoguchi, Masami Suetake, Kazuya Hisamitsu, Hiroaki Ueno, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama
2003 — conf
Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design.
ASP-DAC
Kazuya Hisamitsu, Hiroaki Ueno, Masayasu Tanaka, Daisuke Kitamaru, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama
2002 J jnl
Circuit Simulation Models for Coming MOSFET Generations.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Mitiko Miura-Mattausch, Hiroaki Ueno, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama
2002 J jnl
On discrete random dopant modeling in drift-diffusion simulations: physical meaning of 'atomistic' dopants.
Microelectron. Reliab.
Nobuyuki Sano, Kazuya Matsuzawa, Mikio Mukai, Noriaki Nakayama
2001 — conf
Correlation method of circuit-performance and technology fluctuations for improved design reliability.
ASP-DAC
D. Miyawaki, Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Masami Suetake, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama
2001 — conf
Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability.
CICC
Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Y. Tatsumi, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Terufumi Yamaguchi, Kyoji Yamashita, Noriaki Nakayama
1995 J jnl
Numerical simulation of neuronal population coding: influences of noise and tuning width on the coding error.
Biol. Cybern.
Shoji Tanaka, Noriaki Nakayama