Norbert Seifert

20 papers A* 2A 3C 7Journal 3Unranked 5
YearRankTypeTitle / Venue / Authors
2020 — conf
A Reliability Overview of Intel's 10+ Logic Technology.
IRPS
Rohit Grover, Tony Acosta, C. AnDyke, Emre Armagan, C. Auth, Sunny Chugh, K. Downes, M. Hattendorf, N. Jack, S. Joshi, R. Kasim, Gerald S. Leatherman, S.-H. Lee, C.-Y. Lin, A. Madhavan, H. Mao, A. Lowrie, G. Martin, G. McPherson, Pinakpani Nayak, Adam Neale, D. Nminibapiel, Benjamin Orr, James Palmer, C. M. Pelto, S. S. Poon, I. Post, Tanmoy Pramanik, Anisur Rahman, Stephen Ramey, Norbert Seifert, K. Sethi, Anthony Schmitz, H. Wu, A. Yeoh
2020 — conf
On the Correlation of Laser-induced and High-Energy Proton Beam-induced Single Event Latchup.
IRPS
Bahar Ajdari, Samwel Sekwao, Ricardo Ascázubi, Adam Neale, Norbert Seifert
2015 — conf
MBU-Calc: A compact model for Multi-Bit Upset (MBU) SER estimation.
IRPS
Wei Wu, Norbert Seifert
2015 — conf
Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets.
IRPS
Norbert Seifert, Shah M. Jahinuzzaman, Jyothi Velamala, Nikunj Patel
2013 C conf
Timing vulnerability factors of sequential elements in modern microprocessors.
IOLTS
Arkady Bramnik, Andrei Sherban, Norbert Seifert
2010 A* conf
Explaining cache SER anomaly using DUE AVF measurement.
HPCA
Arijit Biswas, Charles Recchia, Shubhendu S. Mukherjee, Vinod Ambrose, Leo Chan, Aamer Jaleel, Athanasios E. Papathanasiou, Mike Plaster, Norbert Seifert
2010 J jnl
Radiation-induced Soft Errors: A Chip-level Modeling Perspective.
Found. Trends Electron. Des. Autom.
Norbert Seifert
2008 C conf
Soft Error Rates of Hardened Sequentials utilizing Local Redundancy.
IOLTS
Norbert Seifert
2008 C conf
Special Session 1: Radiation Hardening Techniques.
IOLTS
Norbert Seifert
2007 C conf
Design for Resilience to Soft Errors and Variations.
IOLTS
Ming Zhang, T. M. Mak, James W. Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu
2007 C conf
Soft Errors: Technology Trends, System Effects, and Protection Techniques.
IOLTS
Subhasish Mitra, Pia N. Sanda, Norbert Seifert
2006 A conf
Combinational Logic Soft Error Correction.
ITC
Subhasish Mitra, Ming Zhang, Saad Waqas, Norbert Seifert, Balkaran S. Gill, Kee Sup Kim
2006 C conf
Extending Moore's Law into the next Decade - the SER Challenge.
IOLTS
Norbert Seifert
2006 J jnl
Sequential Element Design With Built-In Soft Error Resilience.
IEEE Trans. Very Large Scale Integr. Syst.
Ming Zhang, Subhasish Mitra, T. M. Mak, Norbert Seifert, Nicholas J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag, Sanjay J. Patel
2006 C conf
Soft Error Resilient System Design through Error Correction.
VLSI-SoC
Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim
2006 — conf
Soft Error Resilient System Design through Error Correction.
VLSI-SoC (Selected Papers)
Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim
2005 A* conf
Logic soft errors in sub-65nm technologies design and CAD challenges.
DAC
Subhasish Mitra, Tanay Karnik, Norbert Seifert, Ming Zhang
2005 A conf
Logic soft errors: a major barrier to robust platform design.
ITC
Subhasish Mitra, Ming Zhang, T. M. Mak, Norbert Seifert, Victor Zia, Kee Sup Kim
2005 A conf
Node sensitivity analysis for soft errors in CMOS logic.
ITC
Balkaran S. Gill, Christos A. Papachristou, Francis G. Wolff, Norbert Seifert
2005 J jnl
Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim.
Computer
Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim