Nilesh Goel

12 papers Journal 9Unranked 3
YearRankTypeTitle / Venue / Authors
2025 J jnl
rel-SLIFMEM: Design and analysis of a reliability-aware neuromorphic system.
Integr.
Jani Babu Shaik, Sonal Singhal, Nilesh Goel, Atul Ranjan Srivastava, Siona Menezes Picardo
2024 J jnl
Reliability-aware design of Integrate-and-Fire silicon neurons.
Integr.
Jani Babu Shaik, Siona Menezes Picardo, Sonal Singhal, Nilesh Goel
2022 J jnl
Design and Mathematical Modelling of Inter Spike Interval of Temporal Neuromorphic Encoder for Image Recognition.
CoRR
Aadhitiya VS, Jani Babu Shaik, Sonal Singhal, Siona Menezes Picardo, Nilesh Goel
2022 J jnl
Enabling efficient rate and temporal coding using reliability-aware design of a neuromorphic circuit.
Int. J. Circuit Theory Appl.
Siona Menezes Picardo, Jani Babu Shaik, Sonal Singhal, Nilesh Goel
2022 J jnl
Impact of various NBTI distributions on SRAM performance for FinFET technology.
Integr.
Jani Babu Shaik, Sonal Singhal, Siona Menezes Picardo, Nilesh Goel
2022 J jnl
Investigating the impact of BTI, HCI and time-zero variability on neuromorphic spike event generation circuits.
CoRR
Jani Babu Shaik, Rohit Singh, Siona Menezes Picardo, Nilesh Goel, Sonal Singhal
2022 J jnl
Reliability-aware design of temporal neuromorphic encoder for image recognition.
Int. J. Circuit Theory Appl.
Jani Babu Shaik, Aadhitiya VS, Sonal Singhal, Nilesh Goel
2020 J jnl
Analysis of SRAM metrics for data dependent BTI degradation and process variability.
Integr.
Jani Babu Shaik, Sonal Singhal, Nilesh Goel
2018 — conf
Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and After NBTI Degradation.
iSES
Sarthak Prakash Chaudhari, Jani Babu Shaik, Sonal Singhal, Nilesh Goel
2015 — conf
Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress.
IRPS
Nilesh Goel, Tejas Naphade, Souvik Mahapatra
2015 — conf
Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages.
IRPS
Nilesh Goel, P. Dubey, J. Kawa, S. Mahapatra
2014 J jnl
A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs.
Microelectron. Reliab.
Nilesh Goel, Kaustubh Joshi, S. Mukhopadhyay, N. Nanaware, Souvik Mahapatra