| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 1998 | J | jnl |
J. Electron. Test.
|
| 1998 | J | jnl |
J. Electron. Test.
|
| 1997 | — | conf |
ED&TC
|
| 1996 | Misc | conf |
VTS
|
| 1995 | — | conf |
Asian Test Symposium
|
| 1988 | J | jnl |
IEEE Trans. Computers
|
| 1988 | J | jnl |
IEEE Trans. Computers
|
| 1988 | J | jnl |
IEEE Trans. Computers
|
| 1986 | J | jnl |
IEEE Trans. Computers
|
| 1985 | J | jnl |
IEEE Trans. Computers
|
| 1985 | J | jnl |
IEEE Trans. Computers
|
| 1984 | — | conf |
Fehlertolerierende Rechensysteme
|
| 1983 | J | jnl |
IEEE Trans. Computers
|
| 1983 | J | jnl |
IEEE Trans. Computers
|
| 1983 | J | jnl |
IEEE Trans. Computers
|
| 1983 | J | jnl |
IEEE Trans. Computers
|
| 1979 | J | jnl |
IEEE Trans. Computers
|
| 1978 | J | jnl |
IEEE Trans. Computers
|
| 1978 | J | jnl |
IEEE Trans. Computers
|
| 1978 | J | jnl |
IEEE Trans. Computers
|
| 1977 | J | jnl |
IEEE Trans. Computers
|