Nik Sumikawa - RankMe

22 papers A 12C 2Misc 3Journal 1Unranked 4

Year	Rank	Type	Title / Venue / Authors
2020	A	`conf`	Learning A Wafer Feature With One Training Sample. ITC Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa
2019	A	`conf`	Deploying A Machine Learning Solution As A Surrogate. ITC Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa
2019	—	`conf`	Primitive Concept Identification In A Given Set Of Wafer Maps. VLSI-DAT Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2019	Misc	`conf`	Wafer Pattern Recognition Using Tucker Decomposition. VTS Ahmed Wahba, Li-C. Wang, Zheng Zhang, Nik Sumikawa
2019	—	`conf`	Wafer Plot Classification Using Neural Networks and Tensor Methods. ITC-Asia Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2018	A	`conf`	Concept Recognition in Production Yield Data Analytics. ITC Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2018	J	`jnl`	Discovering Interesting Plots in Production Yield Data Analytics. CoRR Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2017	A	`conf`	Kernel based clustering for quality improvement and excursion detection. ITC Nik Sumikawa, Matt Nero, Li-C. Wang
2017	Misc	`conf`	Learning the process for correlation analysis. VTS Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg
2015	—	`conf`	Mitigating "No trouble found" component returns. IRPS Amr Haggag, Nik Sumikawa, Aamer Shaukat, J. K. Jerry Lee, Nick Aghel, Charlie Slayman
2015	C	`conf`	Reliability/yield trade-off in mitigating "no trouble found" field returns. IOLTS Amr Haggag, Nik Sumikawa, Aamer Shaukat
2014	C	`conf`	Multivariate outlier modeling for capturing customer returns - How simple it can be. IOLTS Jeff Tikkanen, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
2014	A	`conf`	Yield optimization using advanced statistical correlation methods. ITC Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
2013	A	`conf`	A pattern mining framework for inter-wafer abnormality analysis. ITC Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
2012	A	`conf`	An experiment of burn-in time reduction based on parametric test analysis. ITC Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
2012	—	`conf`	Data mining based prediction paradigm and its applications in design automation. VLSI-DAT Magdy S. Abadir, Nik Sumikawa, Wen Chen, Li-C. Wang
2012	A	`conf`	Functional test content optimization for peak-power validation - An experimental study. ITC Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang
2012	A	`conf`	Novel test detection to improve simulation efficiency - A commercial experiment. ICCAD Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir
2012	A	`conf`	Screening customer returns with multivariate test analysis. ITC Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2011	A	`conf`	Forward prediction based on wafer sort data - A case study. ITC Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2011	A	`conf`	Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir
2011	Misc	`conf`	Understanding customer returns from a test perspective. VTS Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir