| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | J | jnl |
Microelectron. J.
|
| 2024 | J | jnl |
Microelectron. J.
|
| 2019 | J | jnl |
CoRR
|
| 2019 | — | conf |
VDAT
|
| 2018 | — | conf |
DRC
|
| 2017 | — | conf |
VDAT
|
| 2017 | — | conf |
ESSDERC
|
| 2016 | Misc | conf |
Analysis and Modeling of Stress over Layer Induced Threshold Voltage Shift in HKMG nMOS Transistors.
VLSID
|
| 2016 | — | conf |
ISQED
|
| 2003 | Misc | conf |
VLSI Design
|
| 2003 | Misc | conf |
VLSI Design
|
| 2001 | Misc | conf |
VLSI Design
|
| 2001 | J | jnl |
Microelectron. Reliab.
|