Nicolas Guitard

11 papers Journal 8Unranked 3
YearRankTypeTitle / Venue / Authors
2022 — conf
Recovery of Intrinsic Heterojunction Bipolar Transistors Profiles by Neural Networks.
BCICTS
Grégoire Caron, Anatoli B. Juditsky, Nicolas Guitard, Didier Céli
2020 — conf
Smart Way to Adjust Schottky Barrier Height in 130 nm BiCMOS Process for sub-THz Applications.
RWS
Vincent Gidel, Frédéric Gianesello, Pascal Chevalier, Grégory Avenier, Nicolas Guitard, Michel Buczko, Cyril Luxey, Guillaume Ducournau
2018 J jnl
Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes.
Microelectron. Reliab.
Jorge Loayza, Nicolas Guitard, Bruno Allard, Luong-Viêt Phung, Blaise Jacquier, Philippe Galy
2012 — conf
BIMOS transistor and its applications in ESD protection in advanced CMOS technology.
ICICDT
Philippe Galy, Jean Jimenez, Johan Bourgeat, A. Dray, Ghislain Troussier, Boris Heitz, Nicolas Guitard, David Marin-Cudraz, H. Beckrich-Ros
2012 J jnl
Symmetrical ESD trigger and pull-up using BIMOS transistor in advanced CMOS technology.
Microelectron. Reliab.
Philippe Galy, Johan Bourgeat, Jean Jimenez, Nicolas Guitard, Alexandre Dray, Ghislain Troussier, Blaise Jacquier, David Marin-Cudraz
2007 J jnl
Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements.
Microelectron. Reliab.
Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères
2006 J jnl
Application of various optical techniques for ESD defect localization.
Microelectron. Reliab.
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
2005 J jnl
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectron. Reliab.
Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis
2004 J jnl
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.
Microelectron. Reliab.
Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas
2004 J jnl
Study of the ESD defects impact on ICs reliability.
Microelectron. Reliab.
Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis
2003 J jnl
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.
Microelectron. Reliab.
David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères