Nico Hellwege

14 papers A 2B 1Journal 2Unranked 9
YearRankTypeTitle / Venue / Authors
2017 J jnl
Design and Verification of Analog CMOS Circuits Using the
J. Low Power Electron.
Timur Schafer, Theodor Hillebrand, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul
2016 J jnl
Analysis of aging effects - From transistor to system level.
Microelectron. Reliab.
Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul
2016 — conf
Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects.
PATMOS
Theodor Hillebrand, Timur Schafer, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul
2016 — conf
Reliability-aware design method for CMOS circuits.
ERMAVSS@DATE
Theodor Hillebrand, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen
2016 — conf
Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits.
MIXDES
Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen
2015 — conf
An aging-aware transistor sizing tool regarding BTI and HCD degradation modes.
MIXDES
Nico Hellwege, Nils Heidmann, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul
2015 — conf
NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits.
IRPS
Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen
2015 — conf
Optimum Operating Points of Transistors with minimal Aging-Aware Sensitivity.
SBCCI
Nico Hellwege, Nils Heidmann, Steffen Paul, Dagmar Peters-Drolshagen
2015 B conf
Variability-aware aging modeling for reliability analysis of an analog neural measurement system.
ETS
Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen
2014 — conf
Analog behavioral modeling for age-dependent degradation of complex analog circuits.
MIXDES
Nils Heidmann, Nico Hellwege, Maike Taddiken, Dagmar Peters-Drolshagen, Steffen Paul
2014 A conf
Modeling of an analog recording system design for ECoG and AP signals.
DATE
Nils Heidmann, Nico Hellwege, Tim Hohlein, Thomas Westphal, Dagmar Peters-Drolshagen, Steffen Paul
2014 — conf
Power efficient digital IC design for a medical application with high reliability requirements.
PATMOS
Nasim Pour Aryan, Nils Heidmann, Martin Wirnshofer, Nico Hellwege, Jonas Pistor, Dagmar Peters-Drolshagen, Georg Georgakos, Steffen Paul, Doris Schmitt-Landsiedel
2013 A conf
Reliability analysis for integrated circuit amplifiers used in neural measurement systems.
DATE
Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul
2013 — conf
Variability-aware gradual aging for generating reliability figures of a neural measurement system.
MIXDES
Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul