Nick van der Meijs

25 papers A* 1A 3C 2Journal 6Unranked 13
YearRankTypeTitle / Venue / Authors
2014 C conf
A 0.1pJ Freeze Vernier time-to-digital converter in 65nm CMOS.
ISCAS
Kristof Blutman, Jan A. Angevare, Amir Zjajo, Nick van der Meijs
2014 J jnl
Considering Crosstalk Effects in Statistical Timing Analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Qin Tang, Amir Zjajo, Michel Berkelaar, Nick van der Meijs
2014 J jnl
Dynamic Thermal Estimation Methodology for High-Performance 3-D MPSoC.
IEEE Trans. Very Large Scale Integr. Syst.
Amir Zjajo, Nick van der Meijs, Rene van Leuken
2014 J jnl
Statistical Transistor-Level Timing Analysis Using a Direct Random Differential Equation Solver.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Qin Tang, Javier Rodríguez, Amir Zjajo, Michel Berkelaar, Nick van der Meijs
2014 — conf
Statistical power optimization of deep-submicron digital CMOS circuits based on structured perceptron.
ISIC
Amir Zjajo, Nick van der Meijs, Rene van Leuken
2013 — conf
A CMOS 0.23pj Freeze Vernier Time-To-Digital Converter.
NORCHIP
Jan A. Angevare, Kristof Blutman, Amir Zjajo, Nick van der Meijs
2013 J jnl
Adaptive Thermal Monitoring of Deep-Submicron CMOS VLSI Circuits.
J. Low Power Electron.
Amir Zjajo, Nick van der Meijs, Rene van Leuken
2013 — conf
Balanced stochastic truncation of coupled 3D interconnect.
ICICDT
Amir Zjajo, Nick van der Meijs, Rene van Leuken
2012 C conf
A 11 µW 0°C-160°C temperature sensor in 90 nm CMOS for adaptive thermal monitoring of VLSI circuits.
ISCAS
Amir Zjajo, Nick van der Meijs, René van Leuken
2012 — conf
Crosstalk-aware statistical interconnect delay calculation.
ASP-DAC
Qin Tang, Amir Zjajo, Michel Berkelaar, Nick van der Meijs
2012 — conf
Direct Statistical Simulation of Timing Properties in Sequential Circuits.
PATMOS
Javier Rodríguez, Qin Tang, Amir Zjajo, Michel Berkelaar, Nick van der Meijs
2012 — conf
Thermal analysis of 3D integrated circuits based on discontinuous Galerkin finite element method.
ISQED
Amir Zjajo, Nick van der Meijs, Rene van Leuken
2012 A conf
Transistor-level gate model based statistical timing analysis considering correlations.
DATE
Qin Tang, Amir Zjajo, Michel Berkelaar, Nick van der Meijs
2011 — conf
Enhanced sensitivity computation for BEM based capacitance extraction using the Schur complement technique.
CICC
Yu Bi, Simon de Graaf, Nick van der Meijs
2011 A conf
Fast statistical analysis of RC nets subject to manufacturing variabilities.
DATE
Yu Bi, Kees-Jan van der Kolk, Jorge Fernandez Villena, Luís Miguel Silveira, Nick van der Meijs
2011 A conf
Pseudo circuit model for representing uncertainty in waveforms.
DATE
Ashish Nigam, Qin Tang, Amir Zjajo, Michel Berkelaar, Nick van der Meijs
2011 J jnl
Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs.
IEEE Trans. Circuits Syst. I Regul. Pap.
Amir Zjajo, Qin Tang, Michel Berkelaar, José Pineda de Gyvez, Alessandro Di Bucchianico, Nick van der Meijs
2010 — conf
Digital cartesian feedback linearization of switched mode power amplifiers.
ICECS
Alejandro Viteri, Amir Zjajo, Thijmen Hamoen, Nick van der Meijs
2010 — conf
Noise analysis of non-linear dynamic integrated circuits.
CICC
Amir Zjajo, Qin Tang, Michel Berkelaar, Nick van der Meijs
2010 A* conf
RDE-based transistor-level gate simulation for statistical static timing analysis.
DAC
Qin Tang, Amir Zjajo, Michel Berkelaar, Nick van der Meijs
2010 J jnl
Statistical Moment Estimation of Delay and Power in Circuit Simulation.
J. Low Power Electron.
Ashish Nigam, Qin Tang, Amir Zjajo, Michel Berkelaar, Nick van der Meijs
2010 — conf
Transistor-Level Gate Modeling for Nano CMOS Circuit Verification Considering Statistical Process Variations.
PATMOS
Qin Tang, Amir Zjajo, Michel Berkelaar, Nick van der Meijs
2009 — conf
A Radix 2
SoCC
Nuo Li, Nick van der Meijs
2009 — conf
Sensitivity computation using domain-decomposition for boundary element method based capacitance extractors.
CICC
Yu Bi, Kees-Jan van der Kolk, Nick van der Meijs
2003 — conf
Analytic model for area and power constrained optimal repeater insertion.
ESSCIRC
Giuseppe S. Garcea, Nick van der Meijs, Ralph H. J. M. Otten