Niccolò Rinaldi

15 papers Misc 1Journal 13Unranked 1
YearRankTypeTitle / Venue / Authors
2018 J jnl
Multi-port dynamic compact thermal models of dual-chip package using model order reduction and metaheuristic optimization.
Microelectron. Reliab.
Brice Rogié, Lorenzo Codecasa, Eric Monier-Vinard, Valentin Bissuel, Najib Laraqi, Olivier Daniel, Dario D'Amore, Alessandro Magnani, Vincenzo d'Alessandro, Niccolò Rinaldi
2018 J jnl
Versatile MOR-based boundary condition independent compact thermal models with multiple heat sources.
Microelectron. Reliab.
Lorenzo Codecasa, Robin Bornoff, James Dyson, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi
2017 J jnl
3-D thermal models calibration by parametric dynamic compact thermal models.
Microelectron. Reliab.
Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi
2017 J jnl
Partition-based approach to parametric dynamic compact thermal modeling.
Microelectron. Reliab.
Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi, Andre G. Metzger, Robin Bornoff, John Parry
2017 J jnl
Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications.
Proc. IEEE
Pascal Chevalier, Michael Schröter, Colombo R. Bolognesi, Vincenzo d'Alessandro, Maria Alexandrova, Josef Böck, Ralf Flickiger, Sébastien Fregonese, Bernd Heinemann, Christoph Jungemann, Rickard Lovblom, Cristell Maneux, Olivier Ostinelli, Andreas Pawlak, Niccolò Rinaldi, Holger Rücker, Gerald Wedel, Thomas Zimmer
2017 J jnl
Simulation comparison of InGaP/GaAs HBT thermal performance in wire-bonding and flip-chip technologies.
Microelectron. Reliab.
Vincenzo d'Alessandro, Antonio Pio Catalano, Alessandro Magnani, Lorenzo Codecasa, Niccolò Rinaldi, Brian Moser, Peter J. Zampardi
2016 J jnl
Advanced thermal simulation of SiGe: C HBTs including back-end-of-line.
Microelectron. Reliab.
Vincenzo d'Alessandro, Alessandro Magnani, Lorenzo Codecasa, Niccolò Rinaldi, Klaus Aufinger
2015 J jnl
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.
Microelectron. Reliab.
Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux
2015 J jnl
Structure-preserving approach to multi-port dynamic compact models of nonlinear heat conduction.
Microelectron. J.
Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi
2013 J jnl
Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations.
Microelectron. Reliab.
Vincenzo d'Alessandro, Alessandro Magnani, Michele Riccio, Yohei Iwahashi, Giovanni Breglio, Niccolò Rinaldi, Andrea Irace
2013 — conf
Dynamic electrothermal macromodeling techniques for thermal-aware design of circuits and systems.
PATMOS
Alessandro Magnani, Vincenzo d'Alessandro, Niccolò Rinaldi, Massimiliano de Magistris, Klaus Aufinger
2013 J jnl
Evaluation of thermal balancing techniques in InGaP/GaAs HBT power arrays for wireless handset power amplifiers.
Microelectron. Reliab.
Andre G. Metzger, Vincenzo d'Alessandro, Niccolò Rinaldi, Peter J. Zampardi
2012 J jnl
An Experimental Power-Lines Model for Digital ASICs Based on Transmission Lines.
IEEE Trans. Very Large Scale Integr. Syst.
Maurizio Costagliola, Davide De Caro, Antonio Girardi, Roberto Izzi, Niccolò Rinaldi, Marco Spirito, Paolo Spirito
2010 J jnl
Avalanche multiplication and pinch-in models for simulating electrical instability effects in SiGe HBTs.
Microelectron. Reliab.
Grazia Sasso, Maurizio Costagliola, Niccolò Rinaldi
2004 Misc conf
Analytical Solutions of the Diffusive Heat Equation as the Application for Multi-cellular Device Modeling - A Numerical Aspect.
International Conference on Computational Science
Zbigniew Lisik, Janusz Wozny, Malgorzata Langer, Niccolò Rinaldi