Nektar Xama - RankMe

16 papers A 4B 5C 1Misc 1Journal 5

Year	Rank	Type	Title / Venue / Authors
2023	J	`jnl`	Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Nektar Xama, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
2023	B	`conf`	High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. ETS Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2022	J	`jnl`	DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2020	B	`conf`	Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. ETS Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
2020	B	`conf`	Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. ETS Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
2020	J	`jnl`	Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst. Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
2020	Misc	`conf`	Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. VTS Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2020	A	`conf`	Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. ITC Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
2019	A	`conf`	Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. ITC Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
2019	A	`conf`	Review of Methodologies for Pre- and Post-Silicon Analog Verification in Mixed-Signal SOCs. DATE Georges G. E. Gielen, Nektar Xama, Karthik Ganesan, Subhasish Mitra
2018	J	`jnl`	ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits. IEEE Des. Test Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
2018	J	`jnl`	An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes. IEEE Des. Test Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
2018	C	`conf`	Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems. ISCAS Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama
2017	B	`conf`	A very low cost and highly parallel DfT method for analog and mixed-signal circuits. ETS Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2017	B	`conf`	Automatic testing of analog ICs for latent defects using topology modification. ETS Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2017	A	`conf`	Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. ITC Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen