Neil Harrison

13 papers Misc 1Journal 4Unranked 8
YearRankTypeTitle / Venue / Authors
2025 J jnl
Establishing pattern sequences using stochastic processes with an application to organizational patterns.
Soc. Netw. Anal. Min.
Viktor Matovic, Valentino Vranic, Waheedullah Sulaiman Khail, Neil Harrison
2025 J jnl
Unleashing cultural diversity knowledge for improved knowledge sharing and integration: an in-depth qualitative analysis.
J. Knowl. Manag.
Yasir Latif, Neil Harrison, Hye-Eun Chu, Ashish Malik, Mai Nguyen
2021 — conf
An Architectural Description For The Application Of Mbse In Complex Systems.
ISSE
Kofoworola Adebowale Odukoya, Robert Ian Whitfield, Laura Hay, Neil Harrison, Malcolm Robb
2020 — conf
A Comparative Study for Obstacle Avoidance Inverse Kinematics: Null-Space Based vs. Optimisation-Based.
TAROS
Neil Harrison, Wenxing Liu, Inmo Jang, Joaquín Carrasco, Guido Herrmann, Nick Sykes
2020 J jnl
Interpreting the Cultural and Academic Experiences of PhD Students from the Indian Sub-Continent and the Chinese Regions in Australian Universities.
Int. J. Emerg. Technol. Learn.
Yasir Latif, Neil Harrison, Hye-Eun Chu
2014 — conf
Teams That Finish Early Accelerate Faster: A Pattern Language for High Performing Scrum Teams.
HICSS
Jeff Sutherland, Neil Harrison, Joel Riddle
2013 — conf
Developer Perceptions of Process Desirability: Test Driven Development and Cleanroom Compared.
HICSS
Jonathan Percival, Neil Harrison
2010 J jnl
Application of Ethernet Pseudowires to MPLS Transport Networks.
RFC
Stewart Bryant, Monique Morrow, George Swallow, Rao Cherukuri, Thomas D. Nadeau, Neil Harrison, Ben Niven-Jenkins
2003 Misc conf
Advanced Pattern Writing.
EuroPLoP
Neil Harrison
2003 — conf
What's so eXtreme about doing things right?
OOPSLA Companion
Steve Berczuk, Neil Harrison, Kevlin Henney, Joshua Kerievsky, Linda Rising, Ken Schwaber, Bobby Woolf
2001 — conf
A Simple via Duplication Tool for Yield Enhancement.
DFT
Neil Harrison
1998 — conf
Orphan Metal Removal as an Element of DFM.
DFT
Neil Harrison
1995 — conf
Yield projection from defect monitors: the influence of gross defects [BiCMOS process].
DFT
Neil Harrison