| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | — | conf |
VDAT
|
| 2024 | — | conf |
LSC@ICMR
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | — | conf |
NTCIR
|
| 2023 | — | conf |
LSC@ICMR
|
| 2023 | J | jnl |
Multim. Tools Appl.
|
| 2023 | — | conf |
NTCIR
|
| 2022 | C | conf |
CBMI
|
| 2022 | — | conf |
NTCIR
|
| 2022 | — | conf |
LSC@ICMR
|
| 2021 | — | conf |
LSC@ICMR
|
| 2021 | — | conf |
VDAT
|
| 2020 | J | jnl |
IET Circuits Devices Syst.
|
| 2020 | J | jnl |
J. Circuits Syst. Comput.
|
| 2020 | — | conf |
ISDCS
|
| 2020 | J | jnl |
IET Circuits Devices Syst.
|
| 2019 | J | jnl |
J. Low Power Electron.
|
| 2019 | C | conf |
TENCON
|
| 2018 | — | conf |
ISED
|
| 2018 | — | conf |
PRIME
|
| 2017 | J | jnl |
Microelectron. J.
|
| 2016 | J | jnl |
Microelectron. J.
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | — | conf |
VDAT
|
| 2014 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2014 | — | conf |
VDAT
|
| 2014 | J | jnl |
Efficient ECSM Characterization Considering Voltage, Temperature, and Mechanical Stress Variability.
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2012 | — | conf |
VDAT
|
| 2012 | — | conf |
ISQED
|
| 2012 | — | conf |
ISED
|
| 2009 | C | conf |
ISCAS
|
| 2009 | C | conf |
ISCAS
|