Nathan Kupp

19 papers A 9B 2Misc 1Journal 4Unranked 3
YearRankTypeTitle / Venue / Authors
2015 A conf
A comparative study of one-shot statistical calibration methods for analog / RF ICs.
ITC
Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang, Yiorgos Makris
2015 J jnl
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models.
IEEE Des. Test
Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris
2015 — conf
Silicon Demonstration of Statistical Post-Production Tuning.
ISVLSI
Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Yiorgos Makris
2013 A conf
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests.
DATE
Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
2013 B conf
On combining alternate test with spatial correlation modeling in analog/RF ICs.
ETS
Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
2013 A conf
Process monitoring through wafer-level spatial variation decomposition.
ITC
Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
2012 J jnl
Applying the Model-View-Controller Paradigm to Adaptive Test.
IEEE Des. Test Comput.
Nathan Kupp, Yiorgos Makris
2012 A conf
Integrated optimization of semiconductor manufacturing: A machine learning approach.
ITC
Nathan Kupp, Yiorgos Makris
2012 A conf
Spatial correlation modeling for probe test cost reduction in RF devices.
ICCAD
Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris
2012 A conf
Spatial estimation of wafer measurement parameters using Gaussian process models.
ITC
Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris
2012 Misc conf
Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier.
VTS
Dzmitry Maliuk, Nathan Kupp, Yiorgos Makris
2011 A conf
Correlating inline data with final test outcomes in analog/RF devices.
DATE
Nathan Kupp, Mustapha Slamani, Yiorgos Makris
2011 J jnl
Improving Analog and RF Device Yield through Performance Calibration.
IEEE Des. Test Comput.
Nathan Kupp, He Huang, Yiorgos Makris, Petros Drineas
2011 A conf
On proving the efficiency of alternative RF tests.
ICCAD
Nathan Kupp, Haralampos-G. D. Stratigopoulos, Petros Drineas, Yiorgos Makris
2010 — conf
DFTT: Design for Trojan Test.
ICECS
Yier Jin, Nathan Kupp, Yiorgos Makris
2010 A conf
Post-production performance calibration in analog/RF devices.
ITC
Nathan Kupp, He Huang, Petros Drineas, Yiorgos Makris
2009 — conf
Experiences in Hardware Trojan Design and Implementation.
HOST
Yier Jin, Nathan Kupp, Yiorgos Makris
2009 J jnl
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction.
J. Electron. Test.
Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris
2008 B conf
Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction.
ETS
Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris