Narendra Devta-Prasanna

24 papers A 6B 1C 2Misc 4Journal 2Unranked 7
YearRankTypeTitle / Venue / Authors
2014 — ch.
Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Sandeep Kumar Goel, Narendra Devta-Prasanna
2014 — ch.
Small-Delay Defect Coverage Metrics.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Narendra Devta-Prasanna, Sandeep Kumar Goel
2012 Misc conf
A novel method for fast identification of peak current during test.
VTS
Wei Zhao, Sreejit Chakravarty, Junxia Ma, Narendra Devta-Prasanna, Fan Yang, Mohammad Tehranipoor
2012 Misc conf
Silicon evaluation of faster than at-speed transition delay tests.
VTS
Sreejit Chakravarty, Narendra Devta-Prasanna, Arun Gunda, Junxia Ma, Fan Yang, H. Guo, R. Lai, D. Li
2010 A conf
Clock Gate Test Points.
ITC
Narendra Devta-Prasanna, Arun Gunda
2010 A conf
Multiple fault activation cycle tests for transistor stuck-open faults.
ITC
Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz
2009 A conf
Accurate measurement of small delay defect coverage of test patterns.
ITC
Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy
2009 A conf
Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study.
ITC
Sandeep Kumar Goel, Narendra Devta-Prasanna, Mark Ward
2009 — conf
Detectability of internal bridging faults in scan chains.
ASP-DAC
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2009 Misc conf
Effective and Efficient Test Pattern Generation for Small Delay Defect.
VTS
Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia
2009 — conf
Improving the Detectability of Resistive Open Faults in Scan Cells.
DFT
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2008 C conf
An Enhanced Logic BIST Architecture for Online Testing.
IOLTS
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2008 J jnl
Comparative study of centralised and distributed compatibility-based test data compression.
IET Comput. Digit. Tech.
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
2008 A conf
Detection of Internal Stuck-open Faults in Scan Chains.
ITC
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2008 — conf
Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells.
DFT
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2008 Misc conf
On the Detectability of Scan Chain Internal Faults - An Industrial Case Study.
VTS
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2007 J jnl
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda
2007 — conf
Systematic Scan Reconfiguration.
ASP-DAC
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
2006 B conf
A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults.
ETS
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2006 — conf
Test Generation for Open Defects in CMOS Circuits.
DFT
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2005 C conf
A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals.
ICCD
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2005 — conf
Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions.
Asian Test Symposium
Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz
2005 A conf
Methods for improving transition delay fault coverage using broadside tests.
ITC
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2005 — conf
Should Illinois-Scan Based Architectures be Centralized or Distributed?
DFT
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda