Narendra Devta-Prasanna

24 papers A 6B 1C 2Misc 4Journal 2Unranked 7

Year	Rank	Type	Title / Venue / Authors
2014	—	`ch.`	Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits Sandeep Kumar Goel, Narendra Devta-Prasanna
2014	—	`ch.`	Small-Delay Defect Coverage Metrics. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits Narendra Devta-Prasanna, Sandeep Kumar Goel
2012	Misc	`conf`	A novel method for fast identification of peak current during test. VTS Wei Zhao, Sreejit Chakravarty, Junxia Ma, Narendra Devta-Prasanna, Fan Yang, Mohammad Tehranipoor
2012	Misc	`conf`	Silicon evaluation of faster than at-speed transition delay tests. VTS Sreejit Chakravarty, Narendra Devta-Prasanna, Arun Gunda, Junxia Ma, Fan Yang, H. Guo, R. Lai, D. Li
2010	A	`conf`	Clock Gate Test Points. ITC Narendra Devta-Prasanna, Arun Gunda
2010	A	`conf`	Multiple fault activation cycle tests for transistor stuck-open faults. ITC Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz
2009	A	`conf`	Accurate measurement of small delay defect coverage of test patterns. ITC Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy
2009	A	`conf`	Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study. ITC Sandeep Kumar Goel, Narendra Devta-Prasanna, Mark Ward
2009	—	`conf`	Detectability of internal bridging faults in scan chains. ASP-DAC Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2009	Misc	`conf`	Effective and Efficient Test Pattern Generation for Small Delay Defect. VTS Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia
2009	—	`conf`	Improving the Detectability of Resistive Open Faults in Scan Cells. DFT Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2008	C	`conf`	An Enhanced Logic BIST Architecture for Online Testing. IOLTS Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2008	J	`jnl`	Comparative study of centralised and distributed compatibility-based test data compression. IET Comput. Digit. Tech. Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
2008	A	`conf`	Detection of Internal Stuck-open Faults in Scan Chains. ITC Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2008	—	`conf`	Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells. DFT Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2008	Misc	`conf`	On the Detectability of Scan Chain Internal Faults - An Industrial Case Study. VTS Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz
2007	J	`jnl`	Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda
2007	—	`conf`	Systematic Scan Reconfiguration. ASP-DAC Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
2006	B	`conf`	A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. ETS Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2006	—	`conf`	Test Generation for Open Defects in CMOS Circuits. DFT Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2005	C	`conf`	A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. ICCD Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2005	—	`conf`	Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions. Asian Test Symposium Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz
2005	A	`conf`	Methods for improving transition delay fault coverage using broadside tests. ITC Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2005	—	`conf`	Should Illinois-Scan Based Architectures be Centralized or Distributed? DFT Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda